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Function-level defect positioning method based on embedding technology

A positioning method and function-level technology, applied in neural learning methods, electrical digital data processing, natural language data processing, etc., can solve problems such as defect positioning effect, impact, and insufficient semantic representation of defect reporting problems, and achieve the effect of improving the effect.

Active Publication Date: 2021-02-05
NANJING UNIV OF AERONAUTICS & ASTRONAUTICS
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  • Abstract
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  • Claims
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AI Technical Summary

Problems solved by technology

These technologies usually cannot represent the contextual semantics of the text well, resulting in insufficient semantic representation of the problem of defect reporting, thus affecting the effect of defect localization

Method used

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  • Function-level defect positioning method based on embedding technology
  • Function-level defect positioning method based on embedding technology
  • Function-level defect positioning method based on embedding technology

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Embodiment Construction

[0026] Embodiments of the invention are described in detail below, examples of which are illustrated in the accompanying drawings. The embodiments described below by referring to the figures are exemplary only for explaining the present invention and should not be construed as limiting the present invention.

[0027] Such as figure 1 As shown, the present invention proposes a function-level defect location method based on embedding technology, which aims to use word embedding and code embedding technology to effectively characterize the semantics of defect reports and function codes so as to effectively locate defects at the function granularity. Including the extraction of software defect reporting problem semantics and functional code functional semantics, the use of pre-trained models, model construction and prediction, and unbalanced class processing, etc.

[0028] figure 1 The workflow of the method proposed by the present invention is shown, including two stages: the s...

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Abstract

The invention discloses a function-level defect positioning method based on an embedding technology, and the method comprises the steps: employing a code embedding technology based on an abstract syntax tree to represent function code function semantics, and employing a word embedding technology to represent defect report problem semantics; finally, fusing the function and the semantic features ofthe defect report by using a convolutional neural network, and predicting a suspicious function related to a given defect. In order to solve the problem of limited training data, a pre-training modelis proposed to perform feature representation on defect reports and codes; meanwhile, aiming at the problem that the number of class instances is unbalanced, a random oversampling method is providedfor processing the class instances. Tests on three mainstream Java projects find that when the recommendation list is 10, the accuracy of the method can reach 12.5%-40%, and the method has great potential in the field of fine-grained defect positioning and has great potential application value on mainstream Java software projects.

Description

technical field [0001] The invention relates to a function-level defect location method based on embedded technology, which belongs to the technical field of defect location and repair in the software development process. Background technique [0002] Software defect location is an important link in the process of software development and maintenance, and plays an irreplaceable role in ensuring and improving the quality of software products. In the past few decades, defect localization technology has been widely concerned and researched by the academic community, and is also considered by software development practitioners in the industry and open source communities to be the most valuable type of software technology. Defect location technology usually locates suspicious codes containing software defects based on program dynamic execution information or static text information, and the granularity of location may be source code files, functions, or code lines, etc. Among va...

Claims

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Application Information

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IPC IPC(8): G06F11/36G06F40/289G06F40/30G06N3/04G06N3/08
CPCG06F11/3608G06F11/3684G06F11/3688G06F40/289G06F40/30G06N3/08G06N3/045
Inventor 邹卫琴李恩铭房春荣张静宣
Owner NANJING UNIV OF AERONAUTICS & ASTRONAUTICS
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