High-precision digital-to-analog converter test system and test method

Abstract

The invention provides a high-precision digital-to-analog converter test system and test method, an automatic test device ATE comprises a digital signal generator and a waveform digitizer, a test channel of the automatic test device ATE is connected with the input of a test carrier plate, and a linear reference DAC, a to-be-tested DAC and an instrument operational amplifier are all installed on the test carrier plate; the input ends of the linear reference DAC and the to-be-tested DAC are connected with the output end of the digital signal generator; the output ends of the linear reference DACand the to-be-tested DAC are respectively connected with the input end of the instrument operational amplifier, and the output end of the instrument operational amplifier is connected with the waveform digitizer; the differential voltage between the in-phase input end and the anti-phase input end of the instrument operational amplifier is amplified through the instrument operational amplifier, direct-current common-mode components are reduced to the maximum extent, and the testing precision of the differential voltage is effectively improved; the waveform digitizer is used for collecting converted voltage error data, accurate testing of the high-precision DAC is achieved, the testing efficiency is high, the cost is low, and the universality is high.

Description

technical field [0001] The invention belongs to the technical field of signal testing, in particular to a high-precision digital-to-analog converter testing system and testing method. Background technique [0002] Digital-to-Analog Converter, DAC for short; as attached figure 1 As shown, the traditional DAC test method uses the input terminal of the DAC to be tested to pass through the connected digital channel, and apply all the input digital numbers one by one. The advantage of the above method is that it is easy to operate, but the disadvantage is that the test time is long and the efficiency is low; taking the 3458A seven and a half digital voltmeter as an example, its single test time is 16.6ms, plus the establishment time, data reading time and transmission time Wait, the whole test process takes about 73ms; for a 16-bit DAC, it takes about 1.33 hours to test 65536 digits, and the full-code test is not feasible for mass production. [0003] Automatic Test Equipment, ...

AI Technical Summary

Problems solved by technology

[0006] Aiming at the technical problems existing in the prior art, the present invention provides a high-precision digital-to-analog converter test system and test method to solve the problem of long test time when the existing ATE full-code test 16-20-bit high-precision DAC , low efficiency, high test cost, and general technical problems cannot be achieved

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