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Data storage device, system-on-chip, radio device and equipment

A data storage device, system-level chip technology, applied in the field of data storage devices, radio devices and equipment, can solve problems such as difficult to write information and read correct information

Pending Publication Date: 2021-03-05
CALTERAH SEMICON TECH SHANGHAI CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] At present, in the FT stage, for large-scale chips, all the functional circuits in the digital logic circuit will not be opened, so it is generally difficult to correctly write information to and read from the E-fuse at this stage correct information

Method used

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  • Data storage device, system-on-chip, radio device and equipment
  • Data storage device, system-on-chip, radio device and equipment
  • Data storage device, system-on-chip, radio device and equipment

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0052] figure 1 It is a schematic structural diagram of the data storage device 100 provided in this application. The data storage device 100 provided in this embodiment can be used in a system-on-chip, see figure 1 As shown, the data storage device 100 may include modules such as a one-time programmable memory 101 and a read / write control module 102 .

[0053] Optionally, the data storage device 100 may further include at least one internal interface and at least one peripheral interface. The internal interface can be used to connect the internal processor 110 of the SoC, the read-write control module 102 and the one-time programmable memory 101 in order to form a first path, and the peripheral interface can be used to connect the external processor 120 of the SoC, The read-write control module 102 and the one-time programmable memory 101 are sequentially connected to form a second path. In the functional testing phase of the system-on-a-chip, the external processor 120 pe...

Embodiment 2

[0063] In order to write the memory repair information into the one-time programmable memory 101 during the wafer testing stage of the SoC. figure 2 It is a schematic structural diagram of the data storage device 200 provided in this application. The data storage device 200 provided in this embodiment can also be used in a system-on-a-chip, see figure 2 As shown, on the basis of the above embodiments, the data storage device 200 further includes: a memory repair module 201 and a first selection control module 202 . see figure 2 As shown, the first selection control module 202 is used to connect the memory repair module 201 with the one-time programmable memory 101 to form a third path. During the wafer test phase of the SoC, the memory repair module 201 can send the memory repair information to the one-time programmable memory 101 through the third channel.

[0064] in the design there are figure 2 In the case of the first selection control module 202 shown, the read-w...

Embodiment 3

[0067] image 3 It is a schematic structural diagram of the data storage device 300 provided in this application. The data storage device 300 provided in this embodiment can also be used in a system-on-chip, see image 3 As shown, on the basis of the above-mentioned embodiments, the data storage device 300 further includes: a second selection control module 301, the second selection control module 301 is used to connect any one of the peripheral interfaces and the internal interfaces with the The read / write control module 102 is connected to form the first path from the internal processor 110 to the one-time programmable memory 101 and the second path from the external processor 120 to the one-time programmable memory 101 described in the above embodiments.

[0068] Optionally, more ports can also be designed on the second selection control module 301, so that more processors can communicate with the one-time programmable memory 101 to form a path, so that more processors can...

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PUM

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Abstract

The invention provides a data storage device, a system-on-chip, a radio device and equipment, and the data storage device is internally provided with a first path which is sequentially communicated with a central processing unit, a read-write control module and a one-time programmable memory, and a second path, which is sequentially communicated with an automatic test machine port, the read-writecontrol module and the one-time programmable memory. In the function test stage of the system-on-chip, an automatic test machine can write specific information of the system-on-chip into the one-timeprogrammable memory through the second path. In the application stage of the system-on-chip, the central processing unit can control data read-write operation of the one-time programmable memory in real time through the first path, and therefore read-write control over the one-time programmable memory by software associated with the internal processor is achieved. The problems that information isdifficult to correctly write into the E-fuse and the information is difficult to correctly read from the E-fuse in the function test stage of the system-on-chip are solved.

Description

technical field [0001] The present application relates to the field of data storage, in particular to a data storage device, system-on-chip, radio device and equipment. Background technique [0002] One Time Programmable (OTP for short) refers to a device that burns some fuses inside the device by generating a large current to write information. The common type of OPT is E-Fuse. The programming feature of E-Fuse makes E-Fuse non-volatile. Therefore, the E-Fuse can be used to store information such as the repair information of the repairable memory of the E-Fuse chip, the serial number of the chip, and the software and hardware version numbers. Generally, the repair information of the repairable memory is written into the E-Fuse at the stage of wafer testing (Chip Probing, CP for short) before chip packaging; the serial number of the chip and the software and hardware version number are functionally tested after the chip packaging is completed. (Function Test, FT for short...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G11C17/14G11C17/16G11C17/18
CPCG11C17/146G11C17/16G11C17/18
Inventor 安发志周文婷
Owner CALTERAH SEMICON TECH SHANGHAI CO LTD