Multi-dimensional vector acceleration factor characterization method for electronic product
A technology of acceleration factor and electronic products, applied in the field of accelerated life test, it can solve the problem that the failure process and mechanism are not considered, and the characterization of the acceleration factor stays in the double stress model.
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[0061] The invention relates to a method for characterizing multi-dimensional vector acceleration factors of electronic products, comprising the following steps:
[0062] S1. Determine the use environment of electronic products;
[0063] S2. Specify the type of accelerated stress in the use environment;
[0064] S3. Determine the failure time model;
[0065] S4. Determine the vector representation of the failure time model;
[0066] S5. Determine the acceleration factor vector representation;
[0067] S6. Numerically solving the acceleration factor.
[0068] Wherein, in step S2, according to the structural characteristics of the electronic product, the type of packaging process, and the environmental conditions of use, environmental factors that are likely to cause failure of the electronic product are selected as the type of accelerated stress.
[0069] The accelerated stress includes temperature, humidity, vibration, electrical stress, and mechanical stress.
[0070] Wh...
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