The invention relates to a film longitudinal thermal diffusion coefficient measuring system and method based on a medium detector, which are used for measuring the longitudinal thermal diffusion coefficient of a film. The film longitudinal thermal diffusion coefficient measuring system comprises a pulse light source, a spectroscope, the medium detector, a preposed current amplifier, an oscilloscope and a photoelectric trigger device, wherein the dielectric detector comprises a grounding metal electrode, a dielectric film and a pressurizing metal electrode which are arranged in sequence, the grounding metal electrode is kept grounded, the pressurizing metal electrode is connected with a direct-current high-voltage power supply, the pressurizing metal electrode is further connected with an input end of a preposed current amplifier, a grounding end of the preposed current amplifier is grounded, one side of the measured film is provided with a laser light target, and the other side is usedfor connecting a grounding metal electrode end of the medium detector. Compared with the prior art, the film longitudinal thermal diffusion coefficient measuring system and the method are simple andeasy to operate, can quickly complete measurement, and can be used for measuring various dielectric films and other metal conductive thin layers which are widely applied to the fields of electrical insulation and microelectronic devices, such as BOPP, PI and PVDF.