The invention relates to a film longitudinal
thermal diffusion coefficient measuring
system and method based on a medium
detector, which are used for measuring the longitudinal
thermal diffusion coefficient of a film. The film longitudinal
thermal diffusion coefficient measuring
system comprises a
pulse light source, a spectroscope, the medium
detector, a preposed current
amplifier, an
oscilloscope and a photoelectric trigger device, wherein the
dielectric detector comprises a grounding
metal electrode, a
dielectric film and a pressurizing
metal electrode which are arranged in sequence, the grounding
metal electrode is kept grounded, the pressurizing metal electrode is connected with a direct-current high-
voltage power supply, the pressurizing metal electrode is further connected with an input end of a preposed current
amplifier, a grounding end of the preposed current
amplifier is grounded, one side of the measured film is provided with a
laser light target, and the other side is usedfor connecting a grounding metal electrode end of the medium detector. Compared with the prior art, the film longitudinal thermal
diffusion coefficient measuring
system and the method are simple andeasy to operate, can quickly complete measurement, and can be used for measuring various
dielectric films and other metal conductive thin
layers which are widely applied to the fields of electrical insulation and microelectronic devices, such as BOPP, PI and PVDF.