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57results about How to "Reduce lateral spread" patented technology

Method for producing high-voltage grid drive chip for directly driving power device

The invention discloses a method for producing a high-voltage grid drive chip for directly driving a power device. By adopting a high-voltage junction isolating process, a high-voltage side drive control module is isolated from a low-voltage side drive control module; on the basis of the PN junction isolation in the conventional CMOS (Complementary Metal-Oxide-Semiconductor Transistor) transistorprocess, a surface electric field reducing region is formed on the surface of a PN junction; a capacitive voltage divider is formed by using two layers of polysilicon; the distribution of an electricfield on the surface of the PN junction is effectively changed; the high-voltage isolation of a high-voltage transverse DMOS (Double-Diffused Metal Oxide Semiconductor) transistor is formed; and a high-voltage N type DMOS transistor is obtained by forming a P type lightly-doped region. Compared with the conventional transverse DMOS transistor, the voltage resistant requirement of over 700V can bemet by additionally arranging a P type surface electric field reducing region structure and a dual-layer polysilicon capacitor structure; and meanwhile, the production method has concise work procedures and lower cost; and a high-voltage grid drive circuit device for directly driving the power device can be formed by only needing 13 structure levels.
Owner:NINGBO SEMICON INT CORP

Support-beam-type MEMS (micro electromechanical systems) fluid thermal conductivity and thermal diffusion coefficient sensor and preparation and testing methods thereof

The invention discloses a support-beam-type MEMS (micro electromechanical systems) fluid thermal conductivity and thermal diffusion coefficient sensor and preparation and testing methods thereof; a heater is arranged at the center of the upper surface of a substrate, a pad is arranged beside the heater on the upper surface of the substrate and is connected to the heater, film of an insulating layer covers the heater, the pad and the substrate, the film of the insulating layer is provided with cavities on two sides of the heater, the bottom of the substrate is provided with a back cavity, and a support beam structure is formed. The heater also acts as a temperature sensor; the heater is of elongated strip structure and is connected to the pad through four leads; by using the back cavity, a fluid under test is used as a substrate of the sensor, thermal conductivity and thermal diffusion coefficient of the fluid under test can be measured directly, and the test process is simplified. The sensor provided herein is suitable for measuring the thermal conductivity and thermal diffusion coefficient of conductive and nonconductive trace liquids.
Owner:XI AN JIAOTONG UNIV

Improved aeration well for in-situ remediation of polluted underground water and remediation method

The invention relates to an improved aeration well for in-situ remediation of polluted underground water and a remediation method. In the improved aeration well, an inner well tube is sleeved in an outer well tube; the inner well tube is fixed in the outer well tube by using an upper fixed bracket and a lower fixed bracket; an aeration head is arranged at the lower part of the inner well tube and is connected with an aeration pump through an aeration pipe; an exhaust hole is arranged at the upper part of the outer well tube and is connected with a contaminated gas monitor; an upper shock tube is arranged at the lower part of the exhaust hole at the upper part of the outer well tube; a top hole of the upper shock tube is lower than the inner well tube; a lower shock tube is arranged on the lower section of the outer well tube; a top hole of the lower shock tube is higher than the bottom end face of the inner well tube; and the bottom end face of the outer well tube is in contact with a base plate of an underground water layer. The invention has the advantage that the transverse diffusion of the pollutants is reduced by increasing the vertical flow of underwater. Compared with the traditional underground water aeration technology and extraction treatment technology, the remediation method has a simpler process, the improved aeration well can continuously operate by conventional maintenance, the remediation efficiency is improved and the remediation cost and the maintenance cost are reduced.
Owner:JILIN UNIV

Super junction semiconductor device manufacturing method capable of improving avalanche capacity

The invention relates to a super junction semiconductor device manufacturing method capable of improving the avalanche capacity. On-resistance is increased correspondingly due to transverse diffusion caused by the traditional high dosage concentration of a column P, and puncture voltage is reduced due to electric charge unbalance of the column P and a column N. According to the method, the epitaxy technology is utilized to form an N-type epitaxy layer; a P-type and N-type epitaxy layer is formed by injecting boron ions; the injection amount of the boron ions increases gradually, and the boron ions are pushed under the high temperature to form a P-type and N-type alternant epitaxy layer; a Pbody area is formed by injecting the boron ions; a polycrystalline silicon gate electrode is formed by etching polycrystalline silicon through the dry method; an N+ source area is formed by injecting arsenic ions; a layer of aluminum is deposited on the upper surface of a whole device, a source metal electrode is formed by etching the aluminum, and a drain electrode is formed on the back face through metallization. According to the super junction semiconductor device obtained through the method, the avalanche capacity of the super junction semiconductor device is improved, and at the same time, on-resistance is reduced.
Owner:XIAN LONTEN RENEWABLE ENERGY TECH +1

Thyristor chip with seven-layer p-n junction isolation structure and preparation method of thyristor chip

The invention discloses a thyristor chip with a seven-layer p-n junction isolation structure and a preparation method of the thyristor chip. The thyristor chip comprises an anode region P1, an N-type long base region, a short base region P2, an N<+>-type cathode region, a front oxidation film, a front gate metal electrode, a front cathode metal electrode, a back anode metal electrode, an annular passivation groove and an isolation ring of the seven-layer p-n junction isolation structure, wherein the isolation ring of the seven-layer p-n junction isolation structure comprises a boron impurity region, a boron-aluminum mixed impurity region, an aluminum impurity region, an aluminum-aluminum overlapping impurity region, an aluminum impurity region, the boron-aluminum mixed impurity region and the boron impurity region from top to bottom; and the isolation ring of the seven-layer p-n junction isolation structure is arranged between the front oxidation film and the back anode metal electrode along the vertical direction and surrounds the peripheries of the anode region P1, the N-type long base region and the short base region P2. The thyristor chip is short in diffusion time, low in production energy consumption, high in efficiency, high in silicon wafer integrity rate, little in transverse diffusion of the isolation region surface and small in isolation region width, and saves the area of the silicon wafer.
Owner:JIANGSU JIEJIE MICROELECTRONICS

VCSEL device with high-dielectric-constant limiting hole and preparation method thereof

The invention discloses a VCSEL device with a high-dielectric-constant current limiting hole and a preparation method thereof. An epitaxial structure of the device sequentially comprises a substrate, a buffer layer, a nitride epitaxial DBR and an N-type semiconductor transmission layer in the epitaxial growth direction. The N-type semiconductor transmission layer is divided into two parts, wehrein the lower layer completely covers the nitride epitaxy DBR. A multi-quantum well layer, a P-type current blocking layer and a P-type semiconductor transmission layer are sequentially arranged on the N-type semiconductor transmission layer; a P-type heavily-doped semiconductor transmission layer; and the outer side of the upper surface of the P-type heavily-doped semiconductor transmission layer is provided with an annular high-dielectric-constant insulating layer which is made of non-doped HfO2 or Ta2O5. Compared with a device with a tunneling junction, the device with the high-dielectric-constant current limiting hole has the advantages that the process time can be reduced by nearly 40%, the light-emitting threshold value can be reduced by about 0.5 mA, and the output power at the temperature of 80 mA is improved by 14.3% compared with that of a conventional device.
Owner:HEBEI UNIV OF TECH

High-frequency triode and manufacturing method

The invention relates to a high-frequency triode and a manufacturing method. The high-frequency triode acquired through the manufacturing method comprises a P-type substrate, a first N-type epitaxiallayer and a second N-type epitaxial layer, two isolation grooves, a collector-electrode phosphorus bridge, a thermal oxide layer and an isolation layer, an inverted trapezoidal opening penetrating thethermal oxide layer, a rectangular opening which penetrates the isolation layer and is connected with the inverted trapezoidal opening, P-type polysilicon and a TEOS layer, an emitting electrode groove penetrating the P-type polysilicon and the TEOS layer, a base region, P-type highly-doped regions on two sides of the base region, an N-type region formed on the surface of the base region, an isolation side wall, emitting electrode polysilicon, a first contact hole, a second contact hole, an emitting electrode, a base electrode and a collector electrode. The first N-type epitaxial layer can bean N-type highly-doped epitaxial layer. The second N-type epitaxial layer is an N-type low-doped epitaxial layer. An isolation oxide layer and the polysilicon are sequentially formed in the isolationgrooves. The material of the isolation layer includes TEOS or BPSG.
Owner:SHENZHEN JINGTE INTELLIGENT MFG TECH CO LTD

Novel shape deep hole with outlet water flow lateral diffusion reduction function

The invention discloses a novel shape deep hole with an outlet water flow lateral diffusion reduction function and belongs to the technical field of drainage building design. The novel shape deep hole with the outlet water flow lateral diffusion reduction function comprises a deep hole body with an emergency valve, a maintenance valve and a transverse seam, the deep hole body comprises an inlet, a barrel and an outlet, both the two sides of the outlet are provided with abutment piers, both the inlet cross section and the outlet cross section of the deep hole body are rectangular, the inlet cross section vertical height is higher than the outlet cross section vertical height, the deviation of the vertical height is not more than 35%, and the transverse width of the inlet cross section is smaller than the transverse width of the outlet cross section. The novel shape deep hole with the outlet water flow lateral diffusion reduction function has a more reasonable shape and is suitable for the deep hole of which sizes of the inlet cross section and the outlet cross section are different, and meanwhile, the phenomenon of outlet water flow lateral diffusion is significantly reduced, water flow is prevented from lashing against the abutment piers, and the structure stability of the deep hole outlet abutment piers is protected effectively.
Owner:NANJING HYDRAULIC RES INST

NPN transistor and fabricating method thereof

The invention provides an NPN transistor and a fabricating method thereof, wherein the NPN transistor comprises a semiconductor substrate, an N-type buried layer region positioned in the semiconductor substrate, a collector electrode positioned in the N-type buried layer region, base electrodes positioned on the N-type buried layer region and the collector electrode, a second oxidization layer positioned on the surface of the base electrodes, an emitting electrode, shallow-doped metal contacts positioned in the base electrodes at two sides of the emitting electrode, side walls positioned at two sides of the emitting electrode and the second oxidization layer and deep-doped regions positioned in the emitting electrode and the base electrodes at two sides of the side walls, wherein the second oxidization layer is internally provided with a contact hole penetrating the thickness of the second oxidization layer; the emitting electrode is filled in the contact hole and cover the surface of the second oxidization layer around the contact hole; and the deep-doped regions are deeper than shallow-doped regions in the base electrodes. The invention can greatly reduce the series resistance, and can lower the influence of side and transient diffusion.
Owner:SHANGHAI HUAHONG GRACE SEMICON MFG CORP

Junction field-effect transistor and manufacturing method thereof

InactiveCN108091575ALow propulsion temperatureShort advance timeSemiconductor/solid-state device manufacturingSemiconductor devicesPolycrystalline siliconOxide
The invention relates to a junction field-effect transistor and a manufacturing method thereof. The junction field-effect transistor obtained by the manufacturing method includes an N-type substrate,an N-type epitaxial layer, a buried P-type gate region formed in the N-type epitaxial layer, an oxide layer, a gate trench penetrating through the oxide layer and extending to the P-type gate region,a P-type diffusion region formed on the inner wall of the gate trench and connected to the P-type gate region, polysilicon formed in the gate trench, an N-type region formed on the surface of the N-type epitaxial layer, an opening penetrating through the oxide layer and corresponding to the N-type region, gate metal formed on the oxide layer and the gate trench and connected to the polysilicon, source metal, and drain metal. The P-type gate region includes a plurality of first parallel bar portions and a plurality of second bar portions perpendicularly intersecting with the first bar portions,the outermost second bar portion being in contact with the gate trench and the P-type diffusion region, and the first bar portion at one side of the outermost second bar portion and the second bar portion being located below the N-type region.
Owner:眉山国芯科技有限公司
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