Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Burr positioning and burr detection model training method and device

A technology for detecting models and positioning methods, which is applied in the field of image recognition, and can solve problems such as glitch detection omissions, inability to cover, deformation of non-rigid O-shaped devices, etc.

Pending Publication Date: 2021-03-19
WATRIX TECH CORP LTD +1
View PDF0 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] In the prior art, the burr location of the O-shaped device is mainly through the method of size measurement, measuring the distance from each point on the edge of the O-shaped device to the center of the circle, and the difference between the distance and the radius is greater than the preset difference The position of the point is determined as the position of the burr, but since the non-rigid O-shaped device is prone to deformation, the measurement process may cause the device to deform and cause a large measurement error; in addition, due to the selection of the O-shaped device edge Points cannot cover all the points on the O-type device, so it may cause the omission of some glitch detection

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Burr positioning and burr detection model training method and device
  • Burr positioning and burr detection model training method and device
  • Burr positioning and burr detection model training method and device

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0086] see figure 1 As shown, it is a schematic flow chart of a burr location method provided in the embodiment of the present application, which includes the following steps:

[0087] Step 101. Obtain the feature data to be inspected of the device to be inspected; the feature data to be inspected is used to characterize the shape characteristics of the feature device to be inspected.

[0088] Step 102: Input the feature data to be detected into a pre-trained glitch detection model to obtain a confidence vector corresponding to the device to be detected.

[0089] Step 103, based on the confidence vector, determine the position of the burr on the device to be tested.

[0090] The following is a detailed description of steps 101 to 103 .

[0091] For step 101:

[0092] When acquiring the feature data of the device to be detected, the image of the device to be detected can be obtained first, and the center point of the device to be detected and the edge of the device to be det...

Embodiment 2

[0129] The embodiment of the present application also provides a burr positioning device, see Figure 5 As shown, it is a schematic diagram of the structure of a burr location device provided by the embodiment of the present application, including a first acquisition module 501, a first detection module 502, and a first determination module 503, wherein the first detection module 502 includes a convolution unit 5021, feature fusion unit 5022, and upsampling unit 5023, specifically:

[0130] The first acquisition module 501 is configured to acquire the feature data to be detected of the device to be detected; the feature data to be detected is used to characterize the shape characteristics of the device to be detected;

[0131] The first detection module 502 is configured to input the feature data to be detected into a pre-trained glitch detection model, the glitch detection model includes a plurality of convolutional neural networks and fully connected networks, different from...

Embodiment 3

[0163] Based on the same technical idea, an embodiment of the present application also provides an electronic device. refer to Figure 7 As shown, it is a schematic structural diagram of an electronic device 700 provided in the embodiment of the present application, including a processor 701 , a memory 702 , and a bus 703 . Among them, the memory 702 is used to store execution instructions, including a memory 7021 and an external memory 7022; the memory 7021 here is also called an internal memory, and is used to temporarily store calculation data in the processor 701 and exchange data with an external memory 7022 such as a hard disk. The processor 701 exchanges data with the external memory 7022 through the memory 7021. When the electronic device 700 is running, the processor 701 communicates with the memory 702 through the bus 703, so that the processor 701 executes the following instructions:

[0164] Obtaining the feature data to be detected of the device to be detected; t...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention provides a burr positioning and burr detection model training method and device. The method comprises the steps of obtaining to-be-detected feature data of a to-be-detected device, wherein the to-be-detected feature data is used for representing shape features of the to-be-detected feature device; inputting the to-be-detected feature data into a pre-trained burr detection model to obtain a confidence coefficient vector corresponding to the to-be-detected device, wherein the values of different elements in the confidence coefficient vector represent the probability that burrs exist at different positions of the to-be-detected device; and based on the confidence coefficient vector, determining a burr position on the to-be-detected device. Through the method, the burr detectionand positioning precision can be improved.

Description

technical field [0001] The present application relates to the technical field of image recognition, in particular to a method and device for training a burr location and burr detection model. Background technique [0002] The O-shaped device refers to a perfectly circular device with a hollow in the middle. Existing O-shaped devices include rigid O-shaped devices that are not easily deformed (such as steel rings) and non-rigid O-shaped devices that are prone to deformation (such as rubber rings). The burr of the O-type device refers to the abnormal raised part on the edge of the O-type device. [0003] In the prior art, the burr location of the O-shaped device is mainly through the method of size measurement, measuring the distance from each point on the edge of the O-shaped device to the center of the circle, and the difference between the distance and the radius is greater than the preset difference The position of the point is determined as the position of the burr, but ...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
IPC IPC(8): G06T7/00G06T7/13G06T7/62G06K9/62G06N3/04G06N3/08
CPCG06T7/0004G06T7/13G06T7/62G06N3/08G06T2207/10024G06T2207/20081G06T2207/20084G06T2207/30164G06N3/045G06F18/253
Inventor 黄永祯徐栋于仕琪王凯
Owner WATRIX TECH CORP LTD
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com