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Test institutes and test equipment

A technology for testing institutions and testing components, which is applied to mechanical equipment, supporting machines, machines/brackets, etc., can solve the problems of high price of testing institutions and low testing accuracy, and achieves improved testing accuracy and testing efficiency, simple structure, and low cost. low effect

Active Publication Date: 2022-03-25
荣成歌尔微电子有限公司
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

In related technologies, there are many types of testing mechanisms, usually driven by a cylinder structure, resulting in high prices for testing mechanisms and low testing accuracy.

Method used

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  • Test institutes and test equipment
  • Test institutes and test equipment
  • Test institutes and test equipment

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Experimental program
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Embodiment Construction

[0042] The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of them. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without creative efforts fall within the protection scope of the present invention.

[0043] It should be noted that all directional indications (such as up, down, left, right, front, back...) in the embodiments of the present invention are only used to explain the relationship between the components in a certain posture (as shown in the figure). Relative positional relationship, movement conditions, etc., if the specific posture changes, the directional indication will also change accordingly.

[0044] At the same time, the meaning of...

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Abstract

The invention discloses a test mechanism and test equipment. The test mechanism includes a base, a test assembly and a pressing structure. The test assembly includes a support base and a detection piece. One end of the support base is connected to the base. The other end of the support base is provided with an installation cavity, the detection part is arranged in the installation cavity, and forms a placement groove surrounded by the inner wall of the installation cavity, and the placement groove is used to place products; the pressing structure Slidingly connected with the support seat, the pressing structure is provided with a pressing member, and the pressing member is provided with a clamping claw adjacent to the notch of the placing groove, and the clamping jaw is used to compress or release the placing product in the tank. The invention aims to provide a testing mechanism which has a simple structure and can ensure a good contact between a product and a testing part. The testing mechanism effectively improves testing accuracy and testing efficiency, and has low cost.

Description

technical field [0001] The invention relates to the technical field of MIC microphone unit detection equipment, in particular to a testing mechanism and testing equipment using the testing mechanism. Background technique [0002] After the microphone is assembled, it needs to be tested for various functions. During the test, the test point needs to be tested in contact with the product. In the related art, there are many types of testing mechanisms, which are usually driven by a cylinder structure, which leads to problems such as high price of the testing mechanism and low testing accuracy. Contents of the invention [0003] The main purpose of the present invention is to provide a testing mechanism and testing equipment, aiming to provide a testing mechanism with a simple structure and capable of ensuring good contact between the product and the test piece. The testing mechanism effectively improves the testing accuracy and testing efficiency, and the cost Low. [0004]...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): H04R29/00F16M11/22
CPCH04R29/00F16M11/22
Inventor 赵志远于南南王鹏周斌
Owner 荣成歌尔微电子有限公司