Communication test method, computer readable storage medium, device and system

Abstract

The invention discloses a communication test method, medium, equipment and system, wherein the method comprises: a chip testing machine establishes a communication connection with a simulation probe station through a general interface bus; Virtual wafer image, and send the data information to the chip testing machine; the chip testing machine generates the corresponding virtual wafer image according to the data information, and sends the start test instruction to the simulation probe station; after the simulation probe station receives the start test instruction , each virtual test point on the virtual wafer image to be tested is tested sequentially, and the corresponding virtual test point position and test results are sent to the chip testing machine after each test, so that the chip testing machine The corresponding test results are displayed synchronously on the image; thus, not only the development cost is reduced and the introduction into production is accelerated, but also the effect of the simulation test is greatly improved.

Description

technical field [0001] The invention relates to the technical field of integrated circuit automatic testing, in particular to a communication testing method, a computer-readable storage medium, a computer device and a communication testing system. Background technique [0002] In related technologies, chip testing is an indispensable link in the process from chip R&D and production to packaging, and probe stations and testing machines are key equipment in the chip testing process. [0003] At present, during the research and development process of the testing machine, it is often necessary to perform some simulation tests on the probe station to verify whether the program of the testing machine is correct. Moreover, the operation of the probe station is highly professional and is not an essential skill for software developers. Even if it can be operated, it will take time and effort to test the program every time, which will affect the efficiency of program development; in a...

AI Technical Summary

Problems solved by technology

[0003] At present, during the research and development process of the testing machine, it is often necessary to perform some simulation tests on the probe station to verify whether the program of the testing machine is correct. Moreover, the operation of the probe station is highly professional and is not an essential skill for software developers. Even if it can be operated, it will take time and effort to test the program every time, which will affect the efficiency of program development; in addition, When the test machine is used to simulate the probe station at the same time for the simulation test, a variety of scalable simulation probe station systems can be constructed, but the communication between the simulation probe station and the test machine cannot be tested, which greatly reduces the test effect.

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