Check patentability & draft patents in minutes with Patsnap Eureka AI!

Multilayer flexible substrate packaging method and packaging structure

A technology of flexible substrates and packaging methods, which is applied to semiconductor/solid-state device parts, semiconductor devices, electrical components, etc., can solve the problems of peeling off metal vias 110, inability to use flexible packaging structures, and damage to the flexibility of flexible devices. Achieve overall flexibility, improved bending performance, and improved bending performance

Active Publication Date: 2021-04-30
浙江荷清柔性电子技术有限公司
View PDF6 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

like figure 1 As shown, through-hole interconnection is achieved by setting metal vias 110 in through-holes 100 to achieve electrical interconnection between layers, but this method cannot be used in flexible packaging structures with high bending
like figure 2 As shown, when the flexible substrate is bent to a large extent, because the metal vias 110 are generally less flexible and cannot be stretched, bending at a large angle may easily cause problems such as peeling and fracture of the metal vias 110 in the through hole 100. Therefore, the existing traditional through-hole metallization process has its shortcomings that cannot be ignored in flexible interconnection.
[0004] Under the demand of high-density, multi-layer wiring substrates, such as image 3 As shown, if the through-hole interconnection process is still used in the flexible substrate, the number of through-holes 100 between flexible device layers will increase day by day, and the high-density metal vias 110 will seriously damage the flexibility of the entire flexible device.

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Multilayer flexible substrate packaging method and packaging structure
  • Multilayer flexible substrate packaging method and packaging structure
  • Multilayer flexible substrate packaging method and packaging structure

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0035] In order to further explain the technical means and effects of the present invention to achieve the intended purpose of the invention, the specific implementation and structure of the multi-layer flexible substrate packaging method and packaging structure proposed according to the present invention will be described below in conjunction with the accompanying drawings and preferred embodiments. , features and their effects are detailed as follows:

[0036] The aforementioned and other technical contents, features and effects of the present invention will be clearly presented in the following detailed description of the preferred embodiments with reference to the drawings. Through the description of the specific implementation, the technical means and effects of the present invention to achieve the intended purpose can be understood more deeply and specifically, but the accompanying drawings are only for reference and description, and are not used to limit the present inve...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

PropertyMeasurementUnit
Line widthaaaaaaaaaa
Login to View More

Abstract

The invention provides a multilayer flexible substrate packaging method and packaging structure. The method comprises the following steps: forming a substrate stacking structure which is provided with a plurality of stacked flexible substrates, wherein each flexible substrate comprises a flexible material substrate, a device disposed on the flexible material substrate, and a lead layer connected with the device; and enabling the lead layer to extend to the edge of the flexible material substrate; processing the side wall, arranged along the stacking direction of the flexible substrate, of the substrate stacking structure so as to expose the lead layer; and forming a side wall connecting layer on the side wall, and connecting the side wall connecting layer with the lead layer. According to the multilayer flexible substrate packaging method, the stability and reliability of the multilayer flexible substrate packaging structure are improved, and meanwhile, the technical difficulty is also reduced.

Description

technical field [0001] The invention relates to the technical field of flexible electronics, and in particular to a multilayer flexible substrate packaging method and packaging structure. Background technique [0002] As flexible electronics that will lead the next generation of electronic revolution, it will be widely used in electronic communication, medical and military fields. With the continuous development of flexible electronics, high-density and three-dimensional interconnection will be the mainstream of the next stage of development. [0003] At present, flexible electronic packaging technology has been borrowed and integrated with traditional semiconductor packaging technology. For example, in the multilayer flexible substrate packaging structure, the through-hole interconnection process has been used in the interlayer interconnection of flexible substrates. Such as figure 1 As shown, through-hole interconnection is achieved by disposing metal vias 110 in through...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
IPC IPC(8): H01L25/065H01L23/31
CPCH01L25/0657H01L25/50H01L23/3107H01L2225/0651H01L2225/06551
Inventor 滕乙超魏瑀刘东亮
Owner 浙江荷清柔性电子技术有限公司
Features
  • R&D
  • Intellectual Property
  • Life Sciences
  • Materials
  • Tech Scout
Why Patsnap Eureka
  • Unparalleled Data Quality
  • Higher Quality Content
  • 60% Fewer Hallucinations
Social media
Patsnap Eureka Blog
Learn More