Optical module test equipment and test method thereof

Abstract

The invention discloses optical module test equipment and a test method thereof. The optical module test equipment comprises a heating platform, test modules, a mouse cage and a heat conduction piece, wherein the heating platform is configured to lay and heat a plurality of optical modules; the test modules are arranged above the heating platform at intervals, and the test modules are used for carrying out high-temperature test on the optical module; the mouse cage is installed on the heating platform through the heat conduction piece, the mouse cage is located under the test module and connected with the test module, and the mouse cage is used for receiving a to-be-tested optical module laid on the heating platform; and the heat conduction piece is used for conducting the temperature of the heating platform to the mouse cage and the optical module under test. Therefore, the time for heating each optical module one by one in a high-temperature test process can be saved, and the test efficiency is improved; in addition, compared with a high-low temperature box and a warm flushing box, the equipment size can be effectively reduced.

Description

Technical field[0001]The present invention relates to the field of optical module testing, and more particularly to a light module test device and a test method thereof.Background technique[0002]The optical module is the core device of optical communication, mainly completes photoelectric conversion. The optical module is widely used in communication devices as a core device. When the optical module operates in a harsh environment, it is necessary to satisfy the industrial temperature requirements of -40 ° C ~ 85 ° C. For current huge production needs, the test of the optical module is to ensure the premise of product performance and quality, and can directly determine the quality and cost of the product.[0003]The optical module has a more test process, including normal temperature initial testing, final test, high temperature test, low temperature test. However, the current test is often used in high and low temperature boxes or is completed in the temperature of the temperature, t...

AI Technical Summary

Problems solved by technology

However, at present, the test is often completed in a high-low temperature box or a temperature-impact box, which is bulky, requires a large test space and personnel, is inconvenient to operate, and can only test one optical module at a time. In addition, the cooling and heating time is relatively long. , the test efficiency is low

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