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Full-sensitivity confrontation importance sampling yield optimization method and device

A sensitive and important technology, applied in the field of data processing, can solve problems such as a large number of expensive simulations, and achieve the effect of avoiding sampling

Active Publication Date: 2021-05-28
TSINGHUA UNIV
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

For high sigma failure rates, the importance sampling method requires a large number of samples in the phase of finding the optimal mean shift vector (OMSV) and actually sampling around the OMSV, yield analysis and optimization based on this always requires a lot of expensive simulations

Method used

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  • Full-sensitivity confrontation importance sampling yield optimization method and device
  • Full-sensitivity confrontation importance sampling yield optimization method and device
  • Full-sensitivity confrontation importance sampling yield optimization method and device

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Embodiment Construction

[0049] Embodiments of the present application are described in detail below, examples of which are shown in the drawings, wherein the same or similar reference numerals denote the same or similar elements or elements having the same or similar functions throughout. The embodiments described below by referring to the figures are exemplary, and are intended to explain the present application, and should not be construed as limiting the present application.

[0050]The full-sensitivity counter-importance sampling yield optimization method and device according to the embodiments of the present application will be described below with reference to the accompanying drawings.

[0051] figure 1 It is a schematic flowchart of a yield optimization method for full-sensitivity counter-importance sampling provided in Embodiment 1 of the present application.

[0052] Such as figure 1 As shown, the full-sensitivity adversarial importance sampling yield optimization method includes the foll...

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Abstract

The invention provides a full-sensitivity confrontation importance sampling yield optimization method and device, and relates to the technical field of data processing, and the method comprises the steps: obtaining a netlist file and a model file of a circuit, and inputting the netlist file and the model file into an external optimizer; analyzing performance indexes of the circuit under the circuit design parameters, and calculating the yield according to the performance indexes; sending the yield to the external optimizer, so that the external optimizer judges whether the yield meets a preset condition or not, and if not, circuit design parameters are updated based on the sensitivity until the yield of the generated circuit meets the preset condition; and obtaining corresponding circuit design parameters when the yield of the circuit meets a preset condition to design the circuit. Thus, sampling in an external optimization process is avoided based on the sensitivity. Meanwhile, the invention provides a yield analysis method for rapid sensitivity importance sampling so as to eliminate searching of an optimal mean shift vector in importance sampling and sampling in subsequent sampling.

Description

technical field [0001] The present application relates to the technical field of data processing, in particular to a method and device for optimizing output of full-sensitivity counter-importance sampling. Background technique [0002] Currently, as the integrated circuit industry enters the field of nanotechnology, process variation is one of the most important components limiting feature size reduction. For high sigma failure rates, the importance sampling method requires a large number of samples in the stage of finding the optimal mean shift vector (OMSV) and the stage of actually sampling around the OMSV, and the yield analysis and optimization based on this always requires a large number of expensive simulations. Contents of the invention [0003] This application aims to solve one of the technical problems in the related art at least to a certain extent. [0004] For this reason, the first purpose of this application is to propose a yield optimization method for fu...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06F30/337G06F30/27G06K9/62G06N3/04G06N3/08G06F111/08G06F111/14G06F115/10
CPCG06F30/337G06F30/27G06N3/08G06F2111/08G06F2111/14G06F2115/10G06N3/045G06F18/2321
Inventor 叶佐昌王燕胡文菲
Owner TSINGHUA UNIV
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