Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Chip register automatic development system based on template variable replacement

A chip register and automatic development technology, which is applied in the fields of instruments, electrical digital data processing, calculation, etc., can solve the problems of low development efficiency, narrow coverage, development efficiency needs to be improved, etc., to reduce workload, ensure consistency, shorten The effect of the chip development cycle

Pending Publication Date: 2021-06-04
吴赛
View PDF2 Cites 2 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0005] The Chinese patent "Method and System for Automatic Generation of Chip Register Codes" (application date 2015.09.30; authorized announcement number CN 105607897 B) discloses an automatic generation system for chip register codes. The solution is to use VisualBasic to call register description files to extract all The register parameters in the above register description document, the biggest problem of this solution is the narrow coverage, and the development efficiency needs to be improved
Chinese patent "Register Automatic Verification Method Based on VMM RAL" (application date 2012.11.27; application publication number CN 103838653 A) discloses an automatic register verification system. Although the actual use of this scheme has a large coverage, the development efficiency is very low
[0006] To sum up, the scale of the chip is getting bigger and bigger, the R&D process is getting longer and longer, the number of large-scale chip registers is tens of thousands, and the workload of designing, verifying and debugging the registers is increasing. The register automatic development system with large scope, high development efficiency and short cycle has become a technical bottleneck for those skilled in the art

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Chip register automatic development system based on template variable replacement
  • Chip register automatic development system based on template variable replacement
  • Chip register automatic development system based on template variable replacement

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0038] The operation of a chip register automatic development system based on template variable replacement of the present invention comprises the following steps:

[0039] A), file read-in: (by) file read-in engine, read in control parameter file, register document file.

[0040] B), (template level) parameter replacement: (by) the file output engine, read in the template (level) file, replace the variables in the template (level) file with the register parameters in the file reading, and finally print out the chip design , verification, and debugging required files.

[0041] Further, step A), during file reading: the control parameter file is all implicit control parameter values ​​read in by the development system, covering all registers;

[0042] In the register file, all registers are managed hierarchically. The classification includes three levels: system (chip level), module (level), and register group; this classification includes all register basic parameters. At the...

Embodiment 2

[0057] The chip register automatic development system provided in this embodiment can automatically generate codes in the stages of chip design, verification and debugging. It includes three steps: the first step is to read in register file and control parameter file. The second step is to read in various template (level) files. In the third step, the output engine calculates the control parameters and register parameters in the first step, replaces all register variables in the template (level) file, and then prints out the automatically generated format file, including register design, verification and debugging file codes .

[0058] Further, the first step: the input engine reads in the control parameter file and the register file.

[0059] Among them, the register document file supports the register standard format files currently used in the chip industry: IPXACT, SystemRDL, Ralf, and supports user-defined WORD, EXCEL and other document format files. In the register do...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention relates to an automatic chip register development system based on template variable replacement. The automatic chip register development system comprises an input file; the input file comprises a register document file, an RTL code, UVM verification, a control parameter file in C and C + + formats, and a template file in an output file format; in a register document file, registers are subjected to level-to-level management, and three levels including a chip level, a module level and a register group are included; according to the method, a Python programming language is used for generating a Python class for each register, a register group and a module level, namely a chip level. Meanwhile, code generation control parameters are converted into the Python classes, then different template files are called, register variables in template level files are replaced according to control parameter values, and finally design, verification and debugging codes of the chip registers are automatically generated.

Description

technical field [0001] The invention belongs to the technical field of digital logic chip development, in particular to a chip register automatic development system based on template variable replacement. Background technique [0002] Since the emergence of digital logic integrated circuit technology in the 1960s, the scale of chips has become larger and larger. At present, the number of transistors in a single chip of VLSI can reach the scale of several billion gates. At the same time, the number and types of internal registers in the chip have also increased significantly with the simultaneous increase in the scale of digital and mixed logic chips. For ultra-large-scale chips, the number of registers can reach hundreds of thousands, and what is even more frightening is the types of registers. There are more than 50 types of commonly used registers, and new types of special registers are constantly being produced. How to quickly and efficiently complete the development of c...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
IPC IPC(8): G06F11/36
CPCG06F11/3604G06F11/3628G06F11/3648
Inventor 吴赛
Owner 吴赛
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products