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Arc Height Measurement Method

A measurement method and arc height technology, applied in measurement devices, instruments, optical devices, etc., can solve the problems of inaccurate measurement results, deformation, inability to accurately measure all types of products, etc., to achieve a wide range of applications, reduce deformation, The effect of measuring data stabilization

Active Publication Date: 2022-04-12
SICHUAN XUHONG OPTOELECTRONICS TECH +2
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0007] The purpose of the embodiments of the present invention is to provide a method for measuring arc height, so as to at least solve the above-mentioned problems that all types of products cannot be accurately measured, and the contact force generated by contact with the product to be measured during the measurement process causes deformation and inaccurate measurement results.

Method used

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Examples

Experimental program
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Embodiment 1

[0055] In this embodiment, the 3D curved glass with an arc height of 23.74mm pressed and formed by a standard mold is used as the object. The height gauge measurement and the above-mentioned measurement method are used to measure the arc height of the glass for many times, and the measurement data obtained by the two measurement methods are obtained and the data are compared and analyzed.

[0056] first, image 3 It is a schematic diagram of the position of the 3D curved glass and the measuring table provided in Embodiment 1 of the present invention, according to image 3 As shown, the curved glass to be measured is vertically placed on the measuring table, so that the outer arc surface of the curved glass to be measured is perpendicular to the measuring table, and the projected figure of the curved glass to be measured is obtained on the measuring table, and Obtaining the minimum enclosing rectangle of the projected graphics, specifically, includes: obtaining the tangent pla...

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Abstract

The invention provides an arc height measurement method, which belongs to the technical field of arc height measurement. The method includes: obtaining the minimum enclosing rectangle of the projection figure of the arc surface element in the horizontal direction, wherein the outer arc surface of the arc surface element is perpendicular to the horizontal plane; determining the arc surface according to the side length of the minimum enclosing rectangle The arc height of the component. The arc height measurement method of the present invention has a wide range of applications, can measure arc surface elements of various shapes, and has stable measurement data and high repeatability, and uses a non-contact method for measurement to avoid deformation of the measurement object due to contact force , the advantage of ensuring the accuracy of the measurement.

Description

technical field [0001] The invention relates to the technical field of arc height measurement, in particular to an arc height measurement method. Background technique [0002] Arc height measurement refers to the measurement of the vertical distance from the vertex or midpoint of a surface arc to the midpoint of a chord. The existing measurement method is to confirm the relative height from the highest point of the product to the reference plane of the product through mechanical measuring instruments such as height gauges. However, there are following disadvantages in adopting this testing method: [0003] First, if the product to be measured is a full-shaped edge product, the product only has point contact with the detection platform, and the product will deflect during the measurement process. For some products with special shapes, it cannot be accurately measured; [0004] Second, glass products are affected by their own weight, and they are prone to deformation when pl...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01B11/06
CPCG01B11/0608
Inventor 李青李赫然何毅展贵鑫王娟娟贺俊雅李大洋
Owner SICHUAN XUHONG OPTOELECTRONICS TECH