Detector temperature control and fault detection system

Abstract

The invention discloses a detector temperature control and fault detection system. The system comprises an MOS tube driving heating strip circuit, a PWM signal optocoupler isolation circuit, a multi-path thermistor temperature detection circuit, an MCU controller, an MOS tube driving fan circuit, a fan rotating speed feedback signal optocoupler isolation circuit and a communication circuit; the MCU controller is responsible for giving out PWM signals for controlling a heating strip and a fan; the PWM signal optocoupler isolation circuit isolates output at the rear end of an MOS tube driver and then is connected to the MCU controller; and the MCU controller calculates whether corresponding frequency is in a normal range or not through input capture. The system can accurately position a fault point, and is convenient to maintain, high in fault removal efficiency, high in reliability and high in stability.

Description

technical field [0001] The invention relates to the technical field of medical devices, and more specifically relates to a detector temperature control and fault detection system. Background technique [0002] When CT scans, high-precision temperature control is often required to obtain good image quality, and the temperature control of the detector often fails due to many control links. Because the existing technical solutions often use simple closed-loop control for temperature control, which only realizes the control function and does not have intermediate control signal detection. If a fault occurs and the temperature cannot be controlled normally, the traditional control solution often cannot quickly locate the fault node. It is more troublesome to troubleshoot and troubleshoot problems in the later maintenance and production debugging process, and the work efficiency is low. Contents of the invention [0003] Aiming at the deficiencies of the prior art, the inventio...

AI Technical Summary

Problems solved by technology

Because the existing technical solutions often use simple closed-loop control for temperature control, which only realizes the control function and does not have intermediate control signal detection. If a fault occurs and the temperature cannot be controlled normally, the traditional control solution often cannot quickly locate the fault node. It is troublesome to troubleshoot and troubleshoot problems in the later maintenance and production debugging process, and the work efficiency is low

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