Wheat plant nitrogen accumulation amount monitoring method based on hyperspectral remote sensing technology
A hyperspectral remote sensing and nitrogen accumulation technology, applied in the field of nitrogen accumulation monitoring in wheat plants, can solve the problems of affecting the adaptability of the model and the influence of the interaction spectrum with little consideration.
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Image
Examples
Embodiment 1
[0034] The method for monitoring nitrogen accumulation in wheat plants based on hyperspectral remote sensing technology specifically includes the following steps:
[0035] (1) Collect spectral data: ASD FieldSpec handheld spectrometer is used, the band range is 350-1075nm, the field of view is 25°, the spectral resolution is 3nm, and the sampling interval is 1.4nm;
[0036] (2) Determination of nitrogen accumulation in wheat plants: separate the wheat plants according to their organs, kill them at 105°C for 30 minutes, dry them at 70°C, and weigh them to obtain the weight of leaves and different organs. After crushing, use the Kjeldahl method to determine Nitrogen content of various organs;
[0037] Among them, nitrogen accumulation = nitrogen content × dry matter;
[0038] (3) Constructing a new vegetation index: use MATLAB software to process the data, analyze the correlation between each vegetation index and the nitrogen accumulation of the plant, select the vegetation ind...
PUM

Abstract
Description
Claims
Application Information

- R&D Engineer
- R&D Manager
- IP Professional
- Industry Leading Data Capabilities
- Powerful AI technology
- Patent DNA Extraction
Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.
© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com