Ferrite high-frequency loading cavity magnetic bias curve testing device and method

Abstract

The invention relates to a ferrite high-frequency loading cavity magnetic bias curve testing device and method, and the device comprises a testing system which is used for outputting sine wave signals of which the frequencies are gradually accumulated or decreased according to a preset frequency interval, and outputting a given voltage source signal at the same time; a high-frequency low-level and power source which is used for filtering and amplifying the output sine wave signal and then outputting the sine wave signal to the ferrite high-frequency loading cavity; a bias current source which is used for outputting corresponding bias current to the ferrite high-frequency loading cavity according to a given voltage source signal; a cavity pressure sampler which is used for sampling the voltage of the ferrite high-frequency loading cavity and then sending the sampled voltage to the testing system; and the testing system automatically adjusts the output given voltage source signal according to the returned cavity pressure sampling signal until the ferrite high-frequency loading cavity reaches a resonance state, so that a magnetic bias curve of the ferrite high-frequency loading cavity is obtained. The device and the method can be widely applied to the field of magnetic bias curve testing.

Description

technical field [0001] The invention belongs to the field of particle accelerator testing, in particular to a device and method for testing the bias curve of a ferrite high-frequency loading chamber of a particle accelerator, and in particular to a fully automatic high-efficiency and high-precision bias curve testing of a ferrite high-frequency loading cavity Devices and methods. Background technique [0002] The ferrite high-frequency loading cavity is one of the core components of the particle synchrotron. One of the important conditions for its stable and reliable operation is to provide the corresponding bias current through the bias power supply at each frequency point of the cavity. bring it into resonance. When the cavity resonates, the relationship between each frequency point and the corresponding bias current setting is the bias curve. The inaccurate bias curve function cannot make the cavity reach the optimal tuning state, and the output current of the final sta...

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Problems solved by technology

[0011] In view of the above problems, the object of the present invention is to provide a ferrite high-frequency loading chamber bias curve testing device and method, which solves the problem of using multiple devices to manually connect in the traditional testing method, and at the same time eliminates the need to observe the oscilloscope with the naked eye. The resulting precision error avoids the influence of all human factors, which can improve system performance and make it reach the optimal tuning state

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