ASPM test method, system, device and medium

A test method and technology of the equipment to be tested, applied in the test field, can solve problems such as error-prone, easy-to-find wrong lines, buffer accumulation, etc., to achieve the effects of increasing searchability, saving test time, and ensuring accuracy

Active Publication Date: 2021-07-16
SHANDONG YINGXIN COMP TECH CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004]1. The Linux OS itself has its own power management, which will have a certain impact on the ASPM function of the PCIE device, so the results may be inaccurate;
[0005]2. Every time a PCIE device is replaced, the BDF number of the device must be searched again, and then execute the lspci –s BDF vvv command. Each PCIE device supports different functions. Search There are many lines in the ASPM information, and it is easy to find the wrong line in the position
Especially when it is set to Per-Port, it is necessary to set ASPM separately for a s

Method used

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  • ASPM test method, system, device and medium
  • ASPM test method, system, device and medium
  • ASPM test method, system, device and medium

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Embodiment Construction

[0047] In order to make the object, technical solution and advantages of the present invention clearer, the embodiments of the present invention will be further described in detail below in conjunction with specific embodiments and with reference to the accompanying drawings.

[0048] It should be noted that all expressions using "first" and "second" in the embodiments of the present invention are to distinguish two entities with the same name but different parameters or parameters that are not the same, see "first" and "second" It is only for the convenience of expression, and should not be construed as a limitation on the embodiments of the present invention, which will not be described one by one in the subsequent embodiments.

[0049] It should be noted that, in the embodiments of the present invention, UEFI (Unified Extensible Firmware Interface) refers to the Unified Extensible Firmware Interface; PCIE (peripheral component interconnectexpress) refers to the high-speed se...

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Abstract

The invention discloses an ASPM test method. The method comprises the following steps: acquiring an recognition number of a device to be tested and an recognition number of a root port corresponding to the device to be tested; obtaining a value of a first register corresponding to the to-be-tested equipment according to the recognition number of the to-be-tested equipment, and obtaining a value of a second register corresponding to the root port according to the recognition number of the root port; judging whether the value of the first register is not less than the value of the second register; responding to the condition that the value of the first register is not smaller than the value of the second register, and confirming that the test passes. The invention further discloses a system, computer equipment and a readable storage medium. According to the scheme provided by the invention, the relationship between the L1 exit time of the root port and the L1 exit time of the to-be-tested equipment is positioned by checking the register, so that the test accuracy is ensured, and the test time is greatly saved.

Description

technical field [0001] The invention relates to the testing field, in particular to an ASPM testing method, system, equipment and storage medium. Background technique [0002] Many PCIE devices in the server, such as network cards, graphics cards, and NVME, support the ASPM function. Currently, the Whitley platform supports two modes of ASPM: L0s and L1. Among them, L0s is the link standby mode, and L1 is the low power consumption standby mode. Due to the large number of PCIE devices, when performing ASPM tests on PCIE devices, generally under Linux, run the lspci-sxxx–vvv command (xxx represents the BDF number of the PCIE device), and then view the device to be tested in the output content ASPM-related information under LnkCap and Device LnkCtl to determine whether the setting takes effect. [0003] However, existing testing methods have the following problems: [0004] 1. The Linux OS itself has its own power management, which will have a certain impact on the ASPM fun...

Claims

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Application Information

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IPC IPC(8): G06F11/22G06F11/263
CPCG06F11/221G06F11/2221G06F11/2273G06F11/2635
Inventor 李彦华
Owner SHANDONG YINGXIN COMP TECH CO LTD
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