OTA test darkroom

Abstract

The present invention provides an OTA test darkroom. The darkroom comprises a shielding shell which defines an internal space of the darkroom, a wave-absorbing material which is arranged on the inner wall surface of the shielding shell, a reflecting surface which is arranged at a first end in the length direction of the internal space of the darkroom, a plane wave generator which is arranged at a second end, opposite to the first end, of the inner space, a rotary table which is arranged in the internal space, is positioned between the reflecting surface and the plane wave generator, and is configured to mount an object to be measured; and a feed source which is arranged in the internal space and is positioned between the reflecting surface and the rotary table. A compact range system is formed by arranging the reflecting surface and the feed source, a plane wave system is formed by arranging the plane wave generator, a near-field system can be formed by utilizing a single probe of the plane wave generator or other replaced probes, and the plane wave system and the compact range system share the rotary table so that three-in-one of the near-field system, the compact range system and the plane wave system is realized; and the cost and the occupied area of the darkroom are reduced on the premise of supporting a broadband and a relatively large dead zone.

Description

technical field [0001] The invention relates to the technical field of OTA testing, in particular to an OTA testing darkroom. Background technique [0002] Currently known OTA (Over-the-Air, air interface) anechoic test sites, for example, are used for OTA test sites of 5G base stations, mainly including far field, near field, compact field, plane wave synthesizer system and reverberation chamber, etc. etc. However, each of these venues has its own advantages and disadvantages. [0003] For near-field and reverberation chambers, they can only be used for TRP (Total Radiated Power, total radiated power) test items, and cannot accurately measure EIRP (Effective Isotropic Radiated Power, equivalent isotropic radiated power) and other directivity Test items. At present, the plane wave synthesizer system can only test equipment in the frequency range of 1.7-6GHz, and cannot measure spurious TRP test items with high index requirements. For the far field, a larger test site is g...

AI Technical Summary

Problems solved by technology

Moreover, due to the large space path loss, it is easy to cause a low signal-to-noise ratio during measurement and obtain poor measurement results

For a compact field, if you need to support lower frequencies and large-scale measurement equipment, you need a larger reflector, and there are also problems of large venues and high costs.

For example, for a device with a frequency of 2 GHz and an antenna size of about 1.2 meters, a reflective surface with a larger size and weight (a projected area of ​​about 2 meters × 2 meters or more, and a weight of about 2 tons) and a test site with a length of about 10 meters are required. Resulting in quite high construction costs, and quite high site load-bearing requirements

Images