Unlock instant, AI-driven research and patent intelligence for your innovation.

Multiplexing voltage drop test circuit

A technology of multiplexing and testing circuits, applied in the direction of measuring current/voltage, using digital measurement technology to measure, measuring devices, etc., can solve the problems of large size, low integration, and insufficient sampling frequency, and achieve high sampling Effects of frequency, small size, easy placement

Pending Publication Date: 2021-07-30
WUHAN EMTEK STANDARD TECH SERVICE CO LTD
View PDF0 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0002] With the increasing progress of automobile testing standards, the requirements for durability testing of various wiring harnesses on automobiles are also becoming more and more stringent. More and more tests require passing a large current during the test, and at the same time, it is necessary to detect the voltage drop on the wiring harness during the test. However, if a programmable power supply is used to monitor the voltage and current of the wiring harness at the same time, a lot of power supplies are required. When the number of samples is particularly large, it is obviously unrealistic to use hundreds of power supplies, and a large number of tests Online on-site will bring great difficulties to the engineer's operation
[0003] Therefore, the best way is to connect the wiring harnesses with the same test current in series to supply power, and then measure the voltage drop on each wire. The usual method is: one is to use an instrument with inspection function. The relay matrix is ​​used to connect the measurement channels to different samples, but the use of relays brings another problem, the switching speed of the relays is not enough, resulting in insufficient sampling frequency
The second is to use a complex number of voltage sensors, so that the sampling frequency is improved, but a new problem arises. When measuring the voltage drop in the middle of the series wiring harness, each channel needs to use an isolated power supply, which will add hundreds of isolated The power supply module, and the sensor also needs to adopt the bus type, because the power supply of the signal also needs to be isolated by the optocoupler, so it is useless to achieve the purpose of reducing the cost
At the same time, the structure is low in integration and bulky

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Multiplexing voltage drop test circuit
  • Multiplexing voltage drop test circuit
  • Multiplexing voltage drop test circuit

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0033]In the first sample group, the sample units R1~Rn are R1~R5, the voltage divider units are 6, the switches Sa1~San are S1~S5, and the switches Sb1~Sbn are S6~S10. MCU 9 adopts STM32F103C8T6 chip, which has 10 acquisition terminals, and can collect voltage data of 10 sample groups through 10 multiplexer boards 2, and the number of sample units in each sample group can be determined according to each multiplexer determined by the maximum number of channels supported by board 2. For example, when a multiplexer board 2 supports 16 channels, 16 sample cells can be connected in series in the sample group, and 10 multiplexer boards 2 can collect the voltage drop data of 160 sample cells in total. At the same time, different sample groups are powered by different power sources, for example, the first sample group is powered by power supply VCC1, and the second sample group is powered by power supply VCC2.

[0034] like Figure 7 As shown, when multiple multiplexing boards 2 ar...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention relates to the technical field of automobile wire harness testing, and is used for testing n sample monomers R1-Rn which are connected in series between a power supply and the ground. The input end of the sample monomer Ri is connected to the input end of a switch Sai through an ith voltage divider monomer, and the output end of the sample monomer Ri is connected to the input end of a switch Sbi through an (i+1)th voltage divider monomer. The output end of a multi-channel analog switch group a and the output end of a multi-channel analog switch group b are connected with an acquisition signal input end of an MCU through an amplifier, the control signal output end of the MCU is connected with the control signal input end of each switch in the multi-channel analog switch group a and the multi-channel analog switch group b, and i is an arbitrary value from 1 to n. There is no need t arrange a power supply in each channel, the cost is low, and meanwhile, higher sampling frequency is ensured.

Description

technical field [0001] The invention relates to the technical field of automobile wiring harness testing, in particular to a multiplexing voltage drop testing circuit. Background technique [0002] With the increasing progress of automobile testing standards, the requirements for durability testing of various wiring harnesses on automobiles are also becoming more and more stringent. More and more tests require passing a large current during the test, and at the same time, it is necessary to detect the voltage drop on the wiring harness during the test. However, if a programmable power supply is used to monitor the voltage and current of the wiring harness at the same time, a lot of power supplies are required. When the number of samples is particularly large, it is obviously unrealistic to use hundreds of power supplies, and a large number of tests Online on-site will bring great difficulties to the engineer's operation. [0003] Therefore, the best way is to connect the wi...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
IPC IPC(8): G01R19/25
CPCG01R19/2503
Inventor 杨晓金杨鸣谦任彬陈静童思维
Owner WUHAN EMTEK STANDARD TECH SERVICE CO LTD