Intelligent metasurface based on latch and control method and controller thereof
A control method and metasurface technology, applied in antennas, electrical components, etc., can solve the problems of high hardware cost, increase of controller, increase of cost, etc., and achieve the effect of reducing control cost, fast response and low cost
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Image
Examples
Embodiment 1
[0082] Such as figure 2 As shown, this embodiment uses the row scanning method. A latch T1 is used in each RIS unit to control the logic level of the RIS. The basic structure of a RIS unit and latch is as follows image 3 As shown, the power and ground pins of the latch have been omitted, the IN pin is connected to the signal line Sj (digital signal), the LE pin is connected to Gi (digital signal), and the OUT pin is connected to the RIS unit (logic level ). Latch Enable (LE) Input High, Output OUT Follows Data Input IN. When LE is low, the output OUT latches at the logic level set at the input.
[0083]The smart metasurface array is controlled by 1 bit. In this embodiment, the smart metasurface has n rows and m columns of RIS units. The controller sends a scan signal to the scan line drive circuit, and the scan line drive circuit gates a certain row of RIS units (in the figure G1, G2, G3, ..., Gn-1, Gn), and then, the controller sends the control signal of this line of ...
Embodiment 2
[0089] Such as Figure 4 As shown, this embodiment uses the column scan mode. At this time, each row is connected to the signal line driving circuit, and each column is connected to the scanning line driving circuit. The smart metasurface shown is still n rows and m columns, and the connection mode of the latches, scanning lines, and signal line driving circuits does not change. Change, that is: the scan line is still connected to the LE pin of the latch, and the signal line is still connected to the input pin of the latch.
PUM
Abstract
Description
Claims
Application Information
- R&D Engineer
- R&D Manager
- IP Professional
- Industry Leading Data Capabilities
- Powerful AI technology
- Patent DNA Extraction
Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.
© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com