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An information storage device for embedded system

An embedded system and information storage technology, applied in memory systems, special data processing applications, memory architecture access/allocation, etc., can solve problems such as no longer writing, affecting correctness or accuracy, and damage to the writing area, to achieve The effect of reducing storage efficiency and avoiding frequent writing

Active Publication Date: 2022-07-19
SHANDONG TRUHIGH TECH DEV CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] The existing method is to write the relevant data to a fixed storage address according to a certain time interval, but the EEPROM memory has a certain lifespan of writing times. If it exceeds a certain number of times, the writing area will be damaged and cannot be written again.
Increasing the writing interval can prolong the service life of the relevant area, but it may affect the correctness or accuracy of the next power-on operation; if the writing time is too short, it will affect the service life of the writing area

Method used

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  • An information storage device for embedded system

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Experimental program
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Effect test

Embodiment 1

[0025] An information storage device for an embedded system, the storage device is composed of a memory, the memory includes a storage linked list and a free linked list, the storage linked list and the free linked list are composed of linearly arranged nodes, and in the nodes of the storage linked list and the free linked list, the forward pointer and The backward pointers correspond to each other, and the nodes are composed of a forward pointer, a backward pointer and a data field. The steps of the storage device power-down storage method are as follows:

[0026] S1: When the memory is powered on and initialized for the first time, two blank doubly linked lists are created in the memory, namely the storage linked list and the free linked list;

[0027] S2: When storing data, the storage linked list compares the data with the stored data to detect whether the data has been stored. If the stored data lacks a node that duplicates the data to be stored, a linked list is extracted...

Embodiment 2

[0031] The steps to check the data based on S3 are as follows:

[0032] After the data is updated to the data field of the storage location, the data is read, and the consistency of the written and read data is checked. If the written data is consistent with the read data, the detection node moves to the next storage node;

[0033] If the written data and read data are inconsistent, the physical space corresponding to the storage node is damaged, the node is deleted from the storage linked list, and a new node is picked from the free linked list. If it is damaged due to power failure, the damaged node is detected by the method of reading and detection, and when writing and reading data, the damaged node is skipped, so as to avoid frequent writing and reading of data on the damaged node, resulting in space write Into corruption and the system does not work properly.

Embodiment 3

[0035] The steps to perform write check on data based on S4 are as follows:

[0036] After extracting a new node from the free linked list, before writing to the new node, check whether the data to be written is equal to the last written data, if the written data is the same as the last written data, cancel the write into the process;

[0037] If the written data is different from the last written data, it will be written. Before writing the data, the stored data will be compared with the last written data, and the data will be written only when the data to be written is different from the original data. Write, avoid frequent writing and reduce the storage efficiency of the memory.

[0038] Working principle: When the memory is powered on and initialized for the first time, two blank doubly linked lists are created in the memory, namely the storage linked list and the free linked list. When storing data, the storage linked list compares the data with the stored data to detect...

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Abstract

The invention discloses an information storage device for an embedded system. The storage device is composed of a memory. The steps of a power-off storage method for the storage device are as follows: two blank doubly linked lists are created in the memory, which are a storage linked list and an idle linked list respectively. , the storage linked list compares the data with the stored data, and detects whether the data has been stored. If the stored data lacks a node that duplicates the data to be stored, a linked list is extracted from the free linked list, added to the storage linked list, and stored in the storage linked list. After finding the corresponding storage location in the linked list, update the data to the data field and read it to check the consistency of the written and read data. Before writing, check the data to be written and the last written data, and decide Whether to write data. The invention can avoid the effect of data reading and writing caused by the damaged nodes in the storage linked list due to power failure, and at the same time prevent the frequent writing of data, which leads to the damage of space writing.

Description

technical field [0001] The invention relates to the technical field of information storage devices, in particular to an information storage device for embedded systems. Background technique [0002] In some embedded devices, unexpected power failures are often encountered. When power failure occurs, some key data needs to be stored in non-volatile memory such as EEPROM. Keep running. [0003] After extensive search, it was found that the prior art, the publication number is CN105531681A, discloses a storage device, which is configured to receive an entry command to enter a deep sleep mode, and is configured to receive a wake-up command to leave the deep sleep mode and enter normal sleep mode. model. In the deep sleep mode, the storage device maintains data stored in the storage device, and in the normal mode, the storage device is accessed normally. If the storage device is controlled to enter the normal mode when the storage device is in the deep sleep mode, the storage ...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G06F12/02G06F16/901
CPCG06F12/023G06F16/9024G06F2212/1036G06F2212/1016
Inventor 孔祥玉赵怀玉
Owner SHANDONG TRUHIGH TECH DEV CO LTD
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