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Infrared measuring device

A measuring device, infrared technology, applied in the direction of optical device exploration, etc., can solve the problem of rising device cost and so on

Pending Publication Date: 2021-08-31
ROHM CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, if a device for performing this method is introduced, the cost of the device will increase as in the case of installing an optical filter.

Method used

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Examples

Experimental program
Comparison scheme
Effect test

Deformed example 1

[0065] In the above-mentioned embodiment, the size of the P layer 33b and the N layer 34b arranged in each visible light receiving part 22 is smaller than the size of the P layer 33a and N layer 34a arranged in the infrared light receiving part 21, so that each visible light receiving part The example in which the light-receiving area S2 of the infrared light-receiving part 21 is smaller than the light-receiving area S1 of the infrared light-receiving part 21 has been described (see above figure 2 as well as Figure 5 ).

[0066] However, the method of making the light receiving area S2 of each visible light receiving section 22 smaller than the light receiving area S1 of the infrared light receiving section 21 is not limited to the above method.

[0067] Figure 11 It is a figure which looked at the light receiving part 20A of this modification 1 from the Z-axis direction. In this light receiving part 20A, by making the size of the P layer 33a and the N layer 34a arranged...

Deformed example 2

[0069] In the above-mentioned embodiment, an example was shown in which the light-receiving areas of the plurality of visible light-receiving parts 22 were substantially equal to each other (see the above-mentioned figure 2 ), however, the light receiving areas of the plurality of visible light receiving units 22 may be different from each other.

[0070] Figure 12 It is a figure which looked at the light receiving part 20B of this modification 2 from the Z-axis direction. In this light receiving unit 20B, the light receiving areas of the plurality of visible light receiving units 22B1 to 22B5 are all smaller than the light receiving area S1 of the infrared light receiving unit 21 and are different from each other. In this way, the light receiving areas of the plurality of visible light receiving units 22B1 to 22B5 may also be made different from each other.

Deformed example 3

[0072] In the above embodiment, an example in which the infrared light receiving unit 21 and the plurality of visible light receiving units 22 are arranged in a straight line has been shown (see the above-mentioned figure 2 ), but the arrangement of the infrared light receiving unit 21 and the plurality of visible light receiving units 22 is not limited to a straight line.

[0073] Figure 13 It is a figure which looked at 20 C of light receiving parts of this modification 3 from the Z-axis direction. In this light receiving unit 20C, a plurality (eight) of visible light receiving units 22 are arranged in a ring shape with the infrared light receiving unit 21 at the center. By deforming in this manner, it is possible to arrange a plurality of visible light receiving units 22 at positions close to the infrared receiving unit 21 .

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PUM

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Abstract

The invention provides an infrared measuring device. The infrared measuring device is provided with: a light-emitting unit that emits infrared light; a light receiving unit (20) that outputs a light current by receiving light; and a measuring unit (40) that measures the light received by the light receiving unit on the basis of the output of the light receiving unit. The light receiving unit (20) includes: a signal line (L1) connected to the measuring unit (40); an infrared light receiving unit (21) having an infrared photodiode (PDi); a plurality of visible light receiving units (22) each having a visible light photodiode (PDv); and a plurality of switches (SW) provided between each of the plurality of visible light photodiodes (PDv) and the signal line (L1).

Description

technical field [0001] The present invention relates to an infrared measurement device capable of measuring infrared rays irradiated on an approaching object. Background technique [0002] Among devices (for example, mobile phones, smart phones, etc.) equipped with a display device using a touch panel method, there are devices that use an infrared measurement device as a measurement device for measuring the ear, face, etc. close to the touch panel. The situation is checked. The infrared measurement device is configured to include an optical proximity sensor that detects that an object (for example, an ear, a face, etc.) approaches the device by measuring infrared rays irradiated on the object. [0003] The proximity sensor detects an approaching object by emitting infrared light from an infrared LED (Light Emitting Diode) to outside, and measuring reflected light from an object using a photodiode. However, when a proximity sensor is used to measure an approaching object, a...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01V8/20
CPCG01V8/20
Inventor 北原崇博齐藤弘治
Owner ROHM CO LTD
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