A Method for Determining Failure Time of Circuit System Considering Random Shock

Abstract

The invention discloses a method for determining the failure time of a circuit system considering random impact. The existing methods for determining the failure time of circuits do not consider random shocks. The invention first determines the failure rate of each component and the initial value of the impact load threshold, and constructs a simulation model; then determines the state transition rate of each component becoming an open circuit or short circuit state and the relative probability of the two types of failure modes of the component; First trigger the failure component and trigger failure mode, calculate the time interval of trigger failure and the failure rate of each component subjected to random impact at the current moment, judge whether the output signal of the circuit system exceeds the threshold, if not, the next trigger failure Components and failure modes are injected into the simulation model. If it exceeds, record the failure time of the circuit system; repeat the cycle, and use the average value of the failure time of all circuit systems as the failure time under random impact load. The invention considers the influence of the impact load on the failure of components, and provides support for the prediction of the life of the circuit.

Description

technical field [0001] The invention relates to the technical field of circuit system failure modeling and analysis, in particular to a method for determining the failure time of a circuit system considering random impact. Background technique [0002] As the main core control system, the circuit system is widely used in aerospace, intelligent manufacturing, rail transit and other fields. Due to the failure of the circuit system, the overall failure of the product, and even the problem of major safety accidents still occur frequently. Analyzing the reason, it is mainly because the internal components may be affected by the external impact load and fail. Such impact loads usually have random characteristics, which are reflected in the arrival time of the impact load and the magnitude of the impact load. Among them, the failure behavior of components is closely related to the size of the impact load. On the one hand, excessive impact load will directly lead to component fail...

AI Technical Summary

Problems solved by technology

However, this method is a "black box" post-analysis method, which cannot recognize the impact of external shocks on the failure of the circuit system in principle, and relies heavily on a large amount of failure data; the other is a method based on fault physics. Calculate the failure time of components with the help of the failure mechanism model, and determine the failure time of the system through the principle of the shortest failure time

However, this method is mainly aimed at wear-out degradation mechanisms, and the impact of component failures caused by random shocks on the system has not been considered

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