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Positioning analysis method for CPU failure position and related product

An analysis method and a technology for locating modules, which are applied in register devices, machine execution devices, and faulty computer hardware detection, can solve the problems of not being able to know the root cause of chip failure and consuming a lot of resources.

Pending Publication Date: 2021-09-10
XIAMEN UNISOC TECH CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

Finding out the root of the problem is a very difficult task in the chip testing stage, which requires a lot of resources and personnel. In the end, only a temporary solution (Work-around) can be obtained, and the root cause of the actual chip failure cannot be known.

Method used

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  • Positioning analysis method for CPU failure position and related product
  • Positioning analysis method for CPU failure position and related product
  • Positioning analysis method for CPU failure position and related product

Examples

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Embodiment 1

[0066] Embodiment 1 of the present application provides a method for locating and analyzing CPU failure locations. The above-mentioned method can be executed by a test system. The technical scenario of the embodiment of the present application can include: controlling the entire process through DJTAG with the help of the ready-made scan chain of DFT; the entire operation During the process, only the CPU is in scan dump mode, and other modules are in normal mode. The test uses a CPU test application case (such as Dhrystone / Maxpower / Antutu, etc.); the method is as follows figure 2 shown, including the following steps:

[0067] Step S201, during the test process, record the state of each register of the scan chain corresponding to each operation command until the hang machine, and obtain a set of corresponding values ​​PC1-Result1, PC2-Result2, PC3-Result3..., PC(n-1)-Result (n-1), PC(n)-Result(n); the set of corresponding values ​​is as follows image 3 shown.

[0068] Step ...

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Abstract

The embodiment of the invention provides a positioning analysis method for CPU failure position and a related product, and the method comprises the steps of, in a CPU test state, iterating a running instruction by a CPU until the iteration running instruction of the CPU is in an abnormal state, and recording the state value of each register of the CPU of the iteration running instruction; comparing the state value of each register of the CPU iterating the operation instruction with the preset real golden value of each register in the test state to obtain a comparison result; and positioning the failure position of the CPU according to the comparison result. The technical scheme of the invention has the advantage of accurate positioning.

Description

technical field [0001] The present application relates to the field of chip technology, in particular to a method for positioning and analyzing CPU failure locations and related products. Background technique [0002] Chip testing is the main means of final mass production certification of chip performance and quality. In an ideal situation, the chip test is successfully completed without bugs. In reality, the chip test is full of problems from the software development of the chip back to the mass production stage. Finding out the root of the problem is a very difficult task in the chip testing stage, which requires a lot of resources and personnel. In the end, only a temporary solution (Work-around) can be obtained, and the root cause of the real chip failure cannot be known. Contents of the invention [0003] The embodiment of the present application discloses a method for locating and analyzing the failure position of a CPU, which can locate the failure position of a c...

Claims

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Application Information

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IPC IPC(8): G06F11/22G06F9/30
CPCG06F11/2236G06F9/30098
Inventor 钟晓炜郑国忠
Owner XIAMEN UNISOC TECH CO LTD
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