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Method for determining thickness of layer of electroconductive material

A technology of conductive materials and coatings, applied in electrical/magnetic thickness measurement, material magnetic variables, and electrical devices, etc., can solve problems such as difficult measurement errors, achieve clear prediction, eliminate possible fluctuations in material properties, and eliminate measurement errors. Effect

Inactive Publication Date: 2004-01-07
ROBERT BOSCH GMBH
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

These two methods are also more difficult to eliminate the measurement error that occurs

Method used

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  • Method for determining thickness of layer of electroconductive material
  • Method for determining thickness of layer of electroconductive material
  • Method for determining thickness of layer of electroconductive material

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Embodiment Construction

[0015] The inventive measuring method is based on the so-called inductive-eddy current measuring principle. exist figure 1 The sensor 10 used is structurally illustrated in . The sensor 10 is placed in the recess of the base body 12 and consists of a coil former 13 mounted on a coil 14 through which a high-frequency alternating current (for example 4 MHz) flows. The coil 14 can be, for example, a flat coil or a toroidal coil. The bobbin 13 essentially consists of an electrically non-conductive and non-ferromagnetic material, such as plastic, and moves in the gap 11 almost without friction. The structural component to be monitored, whose base body is provided with reference numeral 17 , is mounted in a guide body 18 , which positions the structural component and the coil 14 . The coil former 13 and the coil 14 are pressed against the surface of the structural part by means of a spring 19 . On this surface is the layer to be determined. The structural component can be, for ...

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Abstract

A process for determining a thickness of a layer of electrically conductive material, any measurement errors are converted into dimensionless norm values with the aid of a normalization process. In this conversion, measurement errors, for example due to temperature drift and different electrical and magnetic properties of the base material of the carrying body can be largely eliminated. These norm values are converted into layer thickness values with the aid of a calibration curve.

Description

technical field [0001] The present invention relates to a method for determining the thickness of coatings composed of electrically conductive materials, in particular chrome-plated layers. Background technique [0002] Until now, the thickness of, for example, chrome-plated parts was actually measured with X-ray fluorescence. This method is not only expensive, but also time-consuming. So-called inductive measuring methods are also used, but this method can only measure point similarities on the surface and requires high positioning accuracy in practical use. Both methods are also more difficult to eliminate measurement errors that occur. Contents of the invention [0003] It is an object of the present invention to provide a method for determining the thickness of coatings composed of electrically conductive materials which substantially eliminates occurring measurement errors. [0004] According to the invention, a method for determining the thickness of a coating mad...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01B7/06G01D5/20G01N27/72G01R33/12
CPCG01B7/105
Inventor 克劳斯·多布勒汉斯约里·哈赫特尔赖因哈德·迪姆克弗朗茨·奥夫德海德理查德·布拉特尔特约瑟夫·韦伯
Owner ROBERT BOSCH GMBH