Small subsample evaluation method for low-cycle fatigue life curve of material

A low-cycle fatigue and life curve technology, applied in special data processing applications, instruments, electrical digital data processing, etc., can solve problems affecting engineering applications, high test costs, and long test periods.

Active Publication Date: 2021-09-17
NORTHWESTERN POLYTECHNICAL UNIV
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0002] Considering that the high temperature and low cycle strain fatigue test is difficult, the test period is long, and the test funds required are large, and the high temperature and low cycle strain fatigue performan

Method used

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  • Small subsample evaluation method for low-cycle fatigue life curve of material
  • Small subsample evaluation method for low-cycle fatigue life curve of material
  • Small subsample evaluation method for low-cycle fatigue life curve of material

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Embodiment Construction

[0051] Example embodiments will now be described more fully with reference to the accompanying drawings. Example embodiments may, however, be embodied in many forms and should not be construed as limited to the examples set forth herein; rather, these embodiments are provided so that this disclosure will be thorough and complete and fully convey the concept of example embodiments to those skilled in the art.

[0052] Furthermore, the described features, structures, or characteristics may be combined in any suitable manner in one or more embodiments. In the following description, numerous specific details are provided in order to give a thorough understanding of embodiments of the invention. However, those skilled in the art will appreciate that the technical solutions of the present invention may be practiced without one or more of the specific details, or other methods, steps, etc. may be employed. In other instances, well-known methods, step implementations, or operations ...

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Abstract

The invention provides a small subsample evaluation method for a low-cycle fatigue life curve of a material, and the method comprises the steps: obtaining low-cycle fatigue test data, and fitting a relation between a total strain amplitude and a load reverse frequency through a three-parameter power function curve; deforming the three-parameter power function formula to obtain a linear expression in a logarithmic coordinate system, and expressing two parameters in the linear expression as an expression of fatigue limit parameters; solving a relational expression between the other two parameters and the fatigue limit parameter in the three-parameter power function formula, and deducing a function expression of the total strain amplitude between the load reverse frequency and the fatigue limit parameter; in combination with test data, establishing a total residual sum of squares expression of the low-cycle fatigue life curve; and solving an optimal fatigue parameter value through an efficient optimization algorithm, and solving a result of a target parameter in the three-parameter power function expression so as to determine an expression of the low-cycle fatigue life curve. According to the evaluation method disclosed by the invention, the epsilon-N curve result with the minimum total residual sum of squares can be given.

Description

technical field [0001] The invention relates to the technical field of fatigue life evaluation, in particular to a small-sample evaluation method for low-cycle fatigue life curves of materials. Background technique [0002] Considering that the high temperature and low cycle strain fatigue test is difficult, the test period is long, and the test funds are required, the high temperature and low cycle strain fatigue performance is a necessary performance data for the engineering application of some materials, and there is no high temperature and low cycle fatigue performance. The data will impact the engineering applications of these materials. [0003] Therefore, how to give a curve that can better reflect the real strain fatigue life relationship under the small sample test data is very important. [0004] It should be noted that the information disclosed in the above background technology section is only used to enhance the understanding of the background of the present in...

Claims

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Application Information

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IPC IPC(8): G06F30/20G06F113/26G06F119/02
CPCG06F30/20G06F2119/02G06F2113/26Y02T90/00
Inventor 石岩吕震宙
Owner NORTHWESTERN POLYTECHNICAL UNIV
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