Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Dry etching gas control system

A control system, dry etching technology, applied in semiconductor/solid-state device manufacturing, electrical components, discharge tubes, etc., can solve the problems affecting the yield of LED chips, uneven distribution of etching gas, different etching degrees, etc., to improve the uniformity of etching degree, to avoid the effect of different etching degrees and uniform distribution

Inactive Publication Date: 2021-09-28
CHONGQING KONKA PHOTOELECTRIC TECH RES INST CO LTD
View PDF15 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, there is a problem of uneven distribution of etching gas in the prior art, which will lead to different etching degrees of wafer materials at different positions, resulting in the hidden danger of over-etching or under-etching, which seriously affects the yield of LED chips.

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Dry etching gas control system
  • Dry etching gas control system
  • Dry etching gas control system

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0045] In order to make the object, technical solution and advantages of the present invention more clear and definite, the present invention will be further described in detail below with reference to the accompanying drawings and examples. It should be understood that the specific embodiments described here are only used to explain the present invention, not to limit the present invention.

[0046] In the description of the present invention, it should be understood that the orientation or positional relationship indicated by the terms "center", "upper", "lower", "front", "rear", "left", "right" etc. are based on The orientations or positional relationships shown in the drawings are only for the convenience of describing the present invention and simplifying the description, and do not indicate or imply that the referred devices or components must have a specific orientation, be constructed and operated in a specific orientation, and therefore cannot be understood as Limitat...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention provides a dry etching gas control system which comprises an etching cavity; the etching cavity is a sealed cavity, and a gas shunting disc and a wafer bearing disc are arranged in the etching cavity. The gas shunting disc is positioned at the upper part of the etching cavity; a plurality of gas inlet holes are formed in the gas shunting disc, and the density of the gas inlet holes is gradually reduced from the center to the edge of the gas shunting disc; and the wafer bearing disc is located at the lower part of the etching cavity, and the wafer bearing disc is correspondingly arranged below the gas shunting disc. The distribution condition of etching gas in the etching cavity is controlled through the gas shunting disc, and the gas inlet holes in the gas shunting disc are not uniformly distributed but are gradually sparsely distributed from the center to the edge, so that the etching gas entering the etching cavity is more distributed at the center and less distributed at the periphery, and under the action of a gas extraction system, the etching gas actually contacted with a wafer is uniformly distributed, and the etching uniformity of the wafer is improved.

Description

technical field [0001] The invention relates to the fields of semiconductor preparation equipment and light-emitting diode preparation equipment, and relates to a dry etching gas control system, in particular to a gas etching system capable of uniformly distributing etching gas and improving etching uniformity. Background technique [0002] LED, that is, light-emitting diode, emits energy through the recombination of electrons and holes, and can efficiently convert electrical energy into light energy. It has many advantages and is considered to be the next generation of new solid-state light sources entering the field of general lighting. [0003] The wafer material used to make the LED chip includes an epitaxial structure produced by epitaxy, wherein the epitaxial structure specifically includes a first semiconductor layer, a second semiconductor layer and a light emitting layer. In the process of making LED chips, etching the wafer material is an indispensable and importan...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
IPC IPC(8): H01L21/67H01J37/32
CPCH01L21/67017H01L21/67069H01J37/32449H01J2237/334
Inventor 林帅张涛伍凯义苏财钰张嘉修
Owner CHONGQING KONKA PHOTOELECTRIC TECH RES INST CO LTD
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products