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Hollow beam microscopic imaging system and microscopic imaging method

A technology of hollow light beam and microscopic imaging, which is applied in the direction of microscope, optics, optical components, etc., can solve the problems of difficult implementation method and complex reflective lighting structure, and achieve the effect of low cost, broad market promotion and application prospect, and reasonable design

Pending Publication Date: 2021-10-12
西安跃亿智产信息科技有限公司
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  • Claims
  • Application Information

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Problems solved by technology

The advantage of reflective lighting is that the illumination light is completely irradiated on the sample, and the amount of light is relatively sufficient, but the structure of reflective lighting is complicated, and the realization method is difficult

Method used

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  • Hollow beam microscopic imaging system and microscopic imaging method
  • Hollow beam microscopic imaging system and microscopic imaging method

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Embodiment Construction

[0033] The technical solutions of the present invention will be described in detail below in conjunction with the accompanying drawings, so that those skilled in the art can understand the present invention more clearly, but the protection scope of the present invention is not limited thereby.

[0034] The present invention proposes a hollow beam microscopic imaging system, which generally includes: a light source adjustment unit, a hollow beam modulation unit and a dark field imaging unit.

[0035] Specifically, the light source adjustment unit includes a laser 1, a linear polarizer 17 and a third half-wave plate 16 for providing laser beam output, and the laser beam output by the laser 1 is a Gaussian laser beam, which is converted after passing through the linear polarizer 17 For linearly polarized light, the polarization direction is adjusted by the third half-wave plate 16 .

[0036] Preferably, the laser 1 is a continuously tunable ring titanium sapphire laser, the outpu...

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Abstract

The invention provides a hollow light beam microscopic imaging system and a microscopic imaging method. The system comprises a light source adjusting unit, a hollow light beam modulation unit and an objective lens imaging unit, and the light source adjusting unit generates a laser beam and outputs the laser beam to the hollow light beam modulation unit; the hollow light beam modulation unit divides a laser beam generated by the light source adjustment unit into a nonlinear basic laser beam and a nonlinear modulation laser beam according to a preset beam splitting proportion, generates a hollow light beam through nonlinear phase modulation of the nonlinear basic laser beam and the nonlinear modulation laser beam, and outputs the hollow light beam to the objective lens imaging unit. The objective lens imaging unit performs imaging based on the hollow light beam. According to the invention, dark field imaging is realized based on a nonlinear phase modulation technology, and a hollow light beam generated by a nonlinear modulation laser beam in nonlinear phase modulation is used for replacing a light barrier in an existing transmission-type microscopic imaging system, so that the imaging light intensity and the imaging quality are improved.

Description

technical field [0001] The invention relates to the field of microscopic imaging, in particular to a hollow beam microscopic imaging system and a microscopic imaging method. Background technique [0002] Optical microscope is an important tool for studying the microscopic world. Microscopes can be divided into optical wide-field microscopes, confocal microscopes, and stereo microscopes according to their imaging methods. In the optical wide-field microscope, according to the structural characteristics of the specimens to be observed, people have developed technologies such as bright field, dark field, polarized light and fluorescence imaging. Most objects can be observed with bright field microscopy, but some samples are difficult to observe with bright field microscopy because their refractive index is similar to the surrounding environment, and dark field microscopy can solve this problem well. The principle of dark field microscopy is to prevent the light passing throug...

Claims

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Application Information

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IPC IPC(8): G01B9/04G02B21/00G02B21/10
CPCG01B9/04G02B21/0032G02B21/10
Inventor 不公告发明人
Owner 西安跃亿智产信息科技有限公司