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Zero-bias-free temperature drift direct current magnetic field measurement system and method

A technology of DC magnetic field and measurement system, applied in the field of physical quantity measurement, can solve the problems such as the difficulty of eliminating zero offset temperature drift and the low accuracy of measurement results.

Inactive Publication Date: 2021-10-12
SHENZHEN COLIY TECH DEV CO LTD
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Problems solved by technology

[0005] The main purpose of the present invention is to provide a DC magnetic field measurement system and method without zero-bias temperature drift, aiming at solving the problem of using existing methods in the prior art. When measuring the magnetic field to be measured, the zero-bias temperature drift is difficult to eliminate, resulting in measurement Technical issues with lower accuracy of results

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  • Zero-bias-free temperature drift direct current magnetic field measurement system and method
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  • Zero-bias-free temperature drift direct current magnetic field measurement system and method

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Embodiment Construction

[0049]The following will clearly and completely describe the technical solutions in the embodiments of the present application with reference to the accompanying drawings in the embodiments of the present application. Obviously, the described embodiments are only part of the embodiments of the present application, not all of them. Based on the embodiments in this application, all other embodiments obtained by persons of ordinary skill in the art without creative efforts fall within the protection scope of this application.

[0050] It should be noted that all directional indications (such as up, down, left, right, front, back...) in the embodiments of the present application are only used to explain the relationship between the components in a certain posture (as shown in the figure). Relative positional relationship, movement conditions, etc., if the specific posture changes, the directional indication will also change accordingly.

[0051] In this application, unless otherwi...

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Abstract

The invention discloses a zero-bias-free temperature drift direct current magnetic field measurement system and method. The system comprises: a controller, which is used for generating a first measurement instruction based on a received measurement operation, and controlling a magnetic field sensor to move to a target direction; and the magnetic field sensor, which is used for measuring a to-be-measured magnetic field based on the first measurement instruction to obtain a first measurement result, wherein the controller is also used for controlling the magnetic field sensor to move to a direction opposite to the target direction based on the first measurement result and generating a second measurement instruction, the magnetic field sensor is also used for measuring the to-be-measured magnetic field based on the second measurement instruction to obtain a second measurement result, and the controller is further used for acquiring a debiased measurement result based on the first measurement result and the second measurement result. According to the invention, all the system errors, such as zero offset, system bias, inherent errors, zero temperature drift, long-term drift and even flicker noise (1 / f), of the measuring system and the sensor can be almost eliminated, and only gain temperature drift cannot be eliminated.

Description

technical field [0001] The invention relates to the technical field of physical quantity measurement, in particular to a system and method for measuring a DC magnetic field without zero bias and temperature drift. Background technique [0002] For the linear measurement system of the magnetic field, the measured electrical signal Sc has a linear relationship with the original physical signal Sw, namely: Sc = kSw + A, where k is the gain of the entire measurement system, including the sensitivity of the sensor ; A is the zero point offset of the whole measurement system, including the zero offset temperature drift of the sensor. The industry collectively calls it OFFSET. Since both k and A are related to temperature (t), they are functions of temperature, generally quadratic polynomial functions of temperature, so the above formula can be written as follows, including the relationship of temperature dependence: Sc = k(t)Sw + A(t ). This relationship is easy to determine if...

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Application Information

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IPC IPC(8): G01R33/02
CPCG01R33/0082G01R33/02G01R33/0035
Inventor 项飙夏跃春马云镇雷锦春罗宇标
Owner SHENZHEN COLIY TECH DEV CO LTD