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Analog to digital (a/d) converter with internal diagnostic circuit

一种模数转换器、内部诊断的技术，应用在模/数转换、代码转换、仪器等方向，能够解决增加故障模式、需要PCB面积等问题

Pending Publication Date: 2021-10-26
TEXAS INSTR INC
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] The external test circuit 100 has several disadvantages
External test circuit 100 requires PCB area and adds failure modes in safety / critical systems

Method used

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  • Analog to digital (a/d) converter with internal diagnostic circuit
  • Analog to digital (a/d) converter with internal diagnostic circuit
  • Analog to digital (a/d) converter with internal diagnostic circuit

Examples

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Embodiment Construction

[0018] The examples will now be described in detail, and examples thereof are shown in the drawings, and some but not all embodiments are shown. In fact, concepts can be embodied in many different forms, and will not be construed herein. Instead, these descriptions are provided to make this disclosure will meet the applicable requirements.

[0019] figure 2 It is a schematic diagram of an analog number (A / D) converter 200 according to the exemplary embodiment. The A / D converter 200 includes an internal diagnostic circuit 204 that provides a controlled voltage source for testing an output bit of the A / D converter 200, thereby eliminating the need for an external test circuit. The A / D converter 200 can be implemented in an integrated circuit (IC) and can be used in security / critical applications that are desired to high availability.

[0020] refer to figure 2 The A / D converter 200 includes a capacitor array 204 that includes a plurality of capacitors having the respect...

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PUM

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Abstract

An analog to digital (A / D) converter (200) includes a capacitor array (204) having respective first terminals (206) selectively coupled to a reference voltage or ground via a plurality of switches and having respective second terminals (208) coupled to a sample and hold (S / H) output (212). The A / D converter also includes a voltage comparator (230) having a first input coupled to the S / H output (212) and having a second input coupled to a bias voltage. The voltage comparator is configured to output a comparison voltage responsive to a sampled charge at the S / H output and the bias voltage. The A / D converter also includes a successive approximation register (240) coupled to receive the comparison voltage and configured to output an approximate digital code responsive to the comparison voltage, wherein the approximate digital code is varied by controlling an equivalent capacitance of the capacitor array.

Description

Technical field [0001] The present disclosure relates to an analog number (A / D) converter having an internal diagnostic circuit. Background technique [0002] In security / key applications, an analog input (AI) module is used to measure parameters such as temperature, pressure, voltage level, air quality, and the like. The AI ​​module outputs a control signal in response to input parameters, and converts the control signal into a digital code through an anterior (A / D) converter. Since the failure in the AI ​​module is desired in security / key applications, it must be ensured that the output bit of the A / D converter is independent of the phase neighboring position. If one or more output bits of the A / D converter cannot switch to the phase neighboring position, the A / D converter is not suitable for use. [0003] figure 1 An external test circuit 100 for testing the A / D converter 104 is shown. During normal operation mode, an analog signal generated by the AI ​​module...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): H03M1/46
CPCH03M1/468H03M1/1076H03M1/1071H03M1/122
Inventor R·V·库尔卡尼S·摩尔A·K·昆杜M·E·保罗
Owner TEXAS INSTR INC