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A plug-in machine for semiconductor testing and its use method

A plug-in machine and semiconductor technology, applied in the direction of semiconductor/solid-state device testing/measurement, measuring electricity, measuring devices, etc., can solve problems such as low efficiency, and achieve the effect of automatic feeding

Active Publication Date: 2021-12-17
NANTONG HUALONG MICROELECTRONICS
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] The technical problem to be solved by the present invention is: in production, a small stamping machine is usually used to crimp the pins, which is inefficient. In order to solve the problems in the prior art

Method used

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  • A plug-in machine for semiconductor testing and its use method
  • A plug-in machine for semiconductor testing and its use method
  • A plug-in machine for semiconductor testing and its use method

Examples

Experimental program
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Effect test

Embodiment 2

[0094] The present invention also provides a method of using the above-mentioned plugging machine:

[0095] S1. The feeding part 200 transports the material to the plugging mechanism 600;

[0096] S2. The insertion mechanism 600 inserts the pin 000 into the material;

[0097] S3. The feeding part 200 sends the material inserted with the pin 000 to the detection gap 210;

[0098] S4. The horizontal cylinder 330 works to push the detection plate 310 close to the material to be detected;

[0099] S5. Insert the pin 000 of the material to be detected into the detection blind hole 321;

[0100] S6. When the material is a good product, the detection slider 320 is limited by the pin 000, the detection plate 310 continues to approach the workpiece, the push block 312 is raised, and the grooving tool 500 is offset against the pin 000; When the material is a defective product, the detection slider 320 follows the detection plate 310 to approach the workpiece, bends the pin 000, and m...

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PUM

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Abstract

The present invention provides a plug-in machine for semiconductor detection, comprising: a frame, on which a plug-in mechanism is installed; The feeding part is used to transport the pins to the insertion mechanism; the feeding part, the feeding part is arranged on the frame, and the feeding part is used to transfer the material to the end point of the needle feeding part; the insertion The mechanism includes a plug-in part, which can push the stitches delivered to the end point of the needle-feeding part into the material; the material can be automatically sent to the plug-in mechanism through the feeding part, and the automation of stitches can be realized Insertion: the strip-shaped stitches can be delivered to the insertion mechanism through the needle delivery part, so as to realize automatic feeding of the stitches.

Description

technical field [0001] The invention relates to semiconductor detection, in particular to a plug-in machine for semiconductor detection and a method for using the same. Background technique [0002] Semiconductor connectors need to be plugged with several pins before testing. At present, small punching machines are usually used to crimp the pins in production, which is inefficient. Therefore, it is necessary to provide a semiconductor testing plugging machine and its use method of. Contents of the invention [0003] The technical problem to be solved by the present invention is: in production, a small stamping machine is usually used to crimp the pins, which is inefficient. In order to solve the problems in the prior art. The invention provides a plug-in machine for semiconductor testing and a method of using the same to solve the above problems. [0004] The technical solution adopted by the present invention to solve the technical problem is: a plug-in machine for semi...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): H01L21/66G01R1/02G01R1/04
CPCH01L22/14G01R1/02G01R1/0416
Inventor 郑剑华苏建国张元元孙彬朱建
Owner NANTONG HUALONG MICROELECTRONICS
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