Chip testing process for improving production efficiency

Abstract

The invention provides a chip testing process for improving production efficiency. The chip testing process comprises the following steps: 1, installing a chip; 2, switching on current; 3, adjusting a magnetic field; 4, collecting electric signals; 5, electric signal processing; 6, comparing data; and 7, feeding back data. The step 2 of current connection and the step 3 of magnetic field adjustment are carried out synchronously, the time of current connection in the step 2 of current connection and the time of magnetic field adjustment in the step 3 of magnetic field adjustment in the detection process of the SDC117 product are both shortened to 320 ms, the efficiency of first detection is improved by 137.5%, and chips with poor internal bonding are recognized quickly. In the detection process, the original detection time of 440ms is shortened to 320ms, so that the first detection efficiency is improved by 137.5% compared with the original detection time, chips with poor internal bonding can be conveniently and quickly identified, the first detection efficiency of the chips is improved, the occupation efficiency of a Hall detection machine is reduced, and the first detection efficiency is improved; and meanwhile, defective chips which are not detected can still be identified in the subsequent detection after the first detection.

Description

technical field [0001] The invention relates to the technical field of semiconductor processing, in particular to a chip testing process for improving production efficiency. Background technique [0002] The Hall effect tester is used to measure important parameters such as carrier concentration, mobility, resistivity, and Hall coefficient of semiconductor materials, and these parameters must be controlled in advance to understand the electrical characteristics of semiconductor materials, so it is necessary to understand and research An essential tool for the electrical characteristics of semiconductor devices and semiconductor materials; the instrument is a Hall effect instrument with stable performance, powerful functions, and high cost performance. It has a wide range of users and popularity in domestic universities, research institutes, and the semiconductor industry. Portable, mainly used to measure important characteristic parameters of electronic materials, such as ca...

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Problems solved by technology

[0002] The Hall effect tester is used to measure important parameters such as carrier concentration, mobility, resistivity, and Hall coefficient of semiconductor materials, and these parameters must be controlled in advance to understand the electrical characteristics of semiconductor materials, so it is necessary to understand and research An essential tool for the electrical characteristics of semiconductor devices and semiconductor materials; the instrument is a Hall effect instrument with stable performance, powerful functions, and high cost performance. It has a wide range of users and popularity in domestic universities, research institutes, and the semiconductor industry. Portable, mainly used to measure important characteristic parameters of electronic materials, such as carrier concentration, mobility, resistivity, Hall coefficient, etc., thin film or solid material can be used, and its principle is mainly based on the Vanderbilt law; a lifting The chip test process of production efficiency is based on the improvement of Hall effect tester technology to existing chip test process in CN107728036A; During the Hall detection process, it is possible to quickly identify such poorly bonded chips without requiring a long period of power-on to identify such chips. The traditional identification method is Powering on all the chips for a certain period of time cannot quickly identify chips with poor internal bonding, resulting in low detection efficiency and a long time for the detection machine

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