Implementation method of automatic testing system for shaft angle chip
A technology of automatic test system and implementation method, which is applied in the direction of measuring electricity, measuring devices, measuring electrical variables, etc., to achieve the effect of improving test efficiency and reliability
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Embodiment 1
[0028] Embodiment 1, an implementation method of an axis-angle class chip automatic test system, the implementation method is based on the interface control software developed on the LabView platform, cooperates based on the embedded control software developed on the Keil platform, and completes the test and measurement equipment and instruments Parameter setting, manipulation control and data acquisition, realize the communication, data exchange and instruction control between the computer and the main control board, complete the automatic test process, realize the voltage and current of the axis-angle type chip, angle conversion accuracy and integral nonlinear error, speed accuracy and Maximum tracking speed, reference signal frequency, reference center voltage and DC mismatch, reference voltage and AC mismatch, reference voltage and reference voltage suppression, and logic output high level and low level function tests, all data are automatically completed during the test re...
Embodiment 2
[0040] Embodiment 2, the experiment of the implementation method of the automatic test system of the axis angle chip:
[0041] The test equipment supporting the test system includes: computer, integrated cabinet, high-precision axis angle signal source, digital multimeter, multi-program control power supply, main control board, cable and chip positioning fixture, etc. The equipped hardware is rigidly connected by cables , and is controlled, communicated and combined by software, and the human-computer interaction and operation control are completed according to the interface control software, and the communication with the computer, the test instrument and the main control board is realized, the test parameter group is matched according to the predetermined process, and the test cases are mobilized. Chip function indicators are tested, data analyzed, judged and generated reports. refer to figure 1 .
[0042] Specific test items include: voltage and current, angle conversion ...
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