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Method for detecting service life of recycled chip

A detection method and life prediction model technology, applied in nuclear methods, instruments, design optimization/simulation, etc., can solve problems such as failure safety accidents, catastrophic systems, polluted environment, etc., and achieve improved speed, high prediction accuracy, and training time short effect

Active Publication Date: 2021-12-10
慧镕电子系统工程股份有限公司
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0002] Electronic waste, commonly known as "electronic waste", refers to electrical appliances or electronic equipment that are discarded and no longer used. Electronic waste needs to be handled carefully. In some developing countries, the phenomenon of electronic waste is very serious, and the environmental pollution caused threatens the health of local residents. Good health, as an electronic product, electronic chips are mostly recycled by crushing and incineration, which will not only cause a great waste of resources, but also pollute the environment. The so-called recycled chips refer to those produced by the original factory but have been used , The chip removed from the PCB board, one is the aging type, that is, the chip has been used, but still has the function, but the performance is degraded; the other is the function loss type, that is, it can no longer meet the requirements of the component manufacturer. Chips that perform any function according to the specifications. Recycled chips can easily be replaced by criminals with new ones and flow into the market. Once recycled chips are misused in areas such as transportation, critical infrastructure, and military equipment, it may cause catastrophic damage. System failure or major security incidents

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  • Method for detecting service life of recycled chip

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Embodiment Construction

[0040] The implementation mode of the present invention is illustrated by specific specific examples below, and those who are familiar with this technology can easily understand other advantages and effects of the present invention from the contents disclosed in this description. Obviously, the described embodiments are a part of the present invention. , but not all examples. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.

[0041] Terms such as "inside" and other indicated directions or positional relationships are based on the directions or positional relationships shown in the drawings, which are for convenience of description only, and do not indicate or imply that devices or elements must have a specific orientation or be constructed in a specific orientation. and operation, and therefore should not be construed...

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Abstract

The invention discloses a method for detecting the service life of a recycled chip, and the method comprises the following steps: 1, obtaining a chip sample simulation data set which comprises the aging parameters of a chip sample and the service life of the chip sample; 2, screening out key characteristic parameters in the aging parameters by adopting a principal component analysis method to obtain a chip sample simulation training set; 3, establishing a service life prediction model through a gradient lifting decision tree algorithm, and optimizing parameters of the service life prediction model; and 4, cleaning historical data of the recycled chip, obtaining aging parameters of the recycled chip, and inputting aging data of the recycled chip into the service life prediction model to obtain the service life of the recycled chip. According to the invention, dimension reduction fusion is carried out on the aging parameters by adopting the principal component analysis method, the service life prediction model is obtained through training of the gradient boosting decision tree algorithm, the method is used for predicting the service life of the recycled chip, the model fitting speed is high, the training time is short, and the prediction precision is high.

Description

technical field [0001] The invention relates to the technical field of chip recycling, in particular to a method for detecting the service life of recycled chips. Background technique [0002] Electronic waste, commonly known as "electronic waste", refers to electrical appliances or electronic equipment that are discarded and no longer used. Electronic waste needs to be handled carefully. In some developing countries, the phenomenon of electronic waste is very serious, and the environmental pollution caused threatens the health of local residents. Good health, as an electronic product, electronic chips are mostly recycled by crushing and incineration, which will not only cause a great waste of resources, but also pollute the environment. The so-called recycled chips refer to those produced by the original factory but have been used , The chip removed from the PCB board, one is the aging type, that is, the chip has been used, but still has the function, but the performance is...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06F30/27G06K9/62G06N20/10G06F119/04G06F119/08
CPCG06F30/27G06N20/10G06F2119/08G06F2119/04G06F18/2135G06F18/24323
Inventor 魏巍汪姗姗袁燕谭孝东朱光辉李再宝
Owner 慧镕电子系统工程股份有限公司
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