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EVM test device and test method thereof

A test device and test method technology, applied in transmission monitoring, electrical components, transmission systems, etc., can solve problems affecting EVM test results, etc.

Pending Publication Date: 2021-12-10
XINPLETEK SHANGHAI CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Among them, the calculation and evaluation of EVM error vector (including magnitude and phase vector) is its core index. Since EVM is the part of the preamble leading frame in PA transmission, for dynamic switching PA, the influence of transient thermal effect is very obvious, so the initial performance of the frame Will affect the test results of the entire EVM

Method used

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  • EVM test device and test method thereof
  • EVM test device and test method thereof
  • EVM test device and test method thereof

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0056] The method comprises the steps of:

[0057] 1.1 Produce test signals according to the 802.11AX protocol, including 20MHz, 40MHz, 80MHz, and 160MHz waveform signals input to the RF signal source.

[0058] 1.2 For the generated test signal, it is necessary to simulate the dynamic switch state in the actual work of the PA, so a dynamic synchronization signal is introduced. The dynamic signal is generated by an arbitrary waveform generator, and its amplitude is a pulse waveform of 3V. The pulse signal width is the signal length plus a certain protection delay, and the calculation is shown in formula (2)

[0059]

[0060] Considering the dynamic change of the transmission data load in the actual work of the PA, the small load can be defined as (for example, the dynamic duty cycle is 10%), the large load is (for example, the dynamic duty cycle is 90%) and The load is balanced (for example, a dynamic duty cycle of 50%), as three scenarios are tested.

[0061] 1.3 In the ...

Embodiment 2

[0068] In order to further evaluate the dynamic EVM performance of the PA, the following methods are adopted in other embodiments of the application:

[0069] 2.1 Produce test signals according to the 802.11AX protocol, and generate different configurations of frame lengths through the MDU in the protocol. The frame lengths are 0.5ms, 1ms, 2ms, and 4ms respectively, and the waveform signals are input to the signal source.

[0070] 2.2 For a signal with a specific frame length, the pulse signal width of the dynamic synchronization signal is Xi+5us (0.505ms, 1.005ms, 2.005ms, 4.005ms). Based on the pulse period calculation formula (2), the period can be calculated as 1.01ms. 2.01ms, 4.012ms, 8.01ms.

[0071] 2.3 Repeat steps 1.3 to 1.7 in Example 1 to obtain a comparison of dynamic EVM test results under different frame lengths, such as Image 6 shown.

Embodiment 3

[0073] On the other hand, as another key variable for evaluating EVM, the signal duty cycle determines the proportion of its heating and cooling states. Therefore, another embodiment of the present application proposes to dynamically configure the signal duty cycle. Specific examples are as follows:

[0074] 3.1 Use the 802.11AX protocol to produce a test signal X of a single length, for example (1 ms).

[0075] 3.2 For a test signal of a single length, the pulse signal width of the dynamic synchronization signal is Xi+5us, considering the change of the signal duty cycle, such as 10%, 20%, 30%, 40%, 50%, 60, 70%, 80% %, 90% duty cycle, so the pulse signal periods calculated by the formula (2) are respectively, retaining three decimal places.

[0076] Duty cycle (%) 10 20 30 40 50 60 70 80 90 period(ms) 10.05 5.25 3.35 2.513 2.01 1.675 1.436 1.256 1.117

[0077] 3.3 Repeat steps 1.3 to 1.7 in Example 1 to obtain a comparison of dynamic EVM...

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Abstract

The invention discloses an EVM (Error Vector Magnitude) testing device and a testing method thereof. The device comprises a signal source, a waveform generator, a power amplifier and a frequency spectrograph. The signal source is used for outputting a radio frequency test signal. The waveform generator is used for outputting a dynamic synchronization signal to the power amplifier, the signal source and the spectrum analyzer, and the pulse period of the dynamic synchronization signal depends on the signal width of the test signal, the predetermined protection time delay and the dynamic duty ratio. The power amplifier is used for receiving, amplifying and outputting the test signal. The frequency spectrograph is used for receiving an output signal of the power amplifier and carrying out demodulation calculation to obtain an EVM test result. The dynamic synchronization signal is opened and closed according to the period of the test signal, or is opened, and a dynamic EVM test result and a static EVM test result are obtained respectively.

Description

technical field [0001] The invention relates to the technical field of wireless communication, and in particular to an EVM testing device and a testing method thereof. Background technique [0002] In mobile terminals, due to the limited battery capacity, power saving and high efficiency have always been the direction of chip design. In the WIFI system, the PA (power amplifier) ​​occupies a considerable part of the system's DC power consumption, so a new technology is introduced to solve the problem of PA power consumption. One of them is the PA dynamic working mode, which dynamically turns on and off the PA. In this mode, the system will send on and off commands to control the on and off of the PA. This control signal is called the enable signal of the PA. This signal cooperates with the input signal of the PA, and is turned on and off synchronously with the input signal. [0003] 1. When the signal is transmitted, the PA is turned on at the same time as the signal is tr...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): H04B17/00
CPCH04B17/0085
Inventor 张宙远
Owner XINPLETEK SHANGHAI CO LTD