Electrochromic device color change response time detection method and device and storage medium

Abstract

The invention provides an electrochromic device color change response time detection method and device and a storage medium. The detection method comprises the following steps: applying a constant-voltage square wave signal with a fixed period to the electrochromic device; emitting light with a specific wavelength to the electrochromic device; acquiring the waveform of the light after the light is reflected by the electrochromic device; and determining the color change response time of the electrochromic device based on the time interval between the adjacent wave crest and wave trough of the waveform. According to the detection method, the waveform of light passing through the electrochromic device is obtained, and the color change response time of the electrochromic device is determined based on the time interval between the adjacent wave crest and wave trough of the waveform. The detection method can solve the test difficulty of light-proof and non-uniform light-transmitting electrochromic devices, does not need to be tested in a semi-finished product stage, further improves the production efficiency and the product quality, and has the characteristics of simple detection process and high detection accuracy and reliability.

Description

technical field [0001] The invention relates to the technical field of detecting the color change response time of an electrochromic device, in particular to a detection method, a detection device and a computer-readable storage medium for the color change response time of an electrochromic device. Background technique [0002] Electrochromic devices have begun to be used more and more, such as exterior glass of buildings, color-changing housings of electronic equipment, and the like. Among them, several most important index tests of electrochromic devices, such as response time and discoloration efficiency, are mainly tested and analyzed by the change of transmittance of the device in academia and industry. Taking the response time as an example, the response time of an electrochromic device is roughly defined by the difference between the peak transmittance and the valley transmittance. [0003] The test scheme based on the change of transmittance can only be used for tra...

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Problems solved by technology

[0003] The test scheme based on the change of transmittance can only be used for transparent devices, and it is not applicable if there are other opaque films or light through inhomogeneous media, such as electrochromic devices and textured films as substrates, frosted glass, etc. Compatible Composite Structural Parts

In this case, the performance of the product can only be monitored in the middle of the manufacturing process. The performance test of the semi-finished product is done before the electrochromic device is attached to other film layers, and there is nothing to be done for the test of the finished product.

[0004] Moreover, when the electrochromic device is not bonded with other film layers, the optical performance of the semi-finished product cannot represent the real use scenario of the electrochromic device (after the electrochromic device is combined with other film layers, its overall color effect will change) , so the performance test of the semi-finished product when the electrochromic device has not been bonded to other film layers cannot reflect the optical performance of the finished electrochromic device (after bonding other film layers), and the transmittance scheme in conventional technology cannot Realize the detection of optical properties (especially response time) of finished electrochromic devices

[0005] In addition, testing the response time performance of electrochromic devices at the semi-finished stage will seriously affect the overall production efficiency of the device, and there is no way to know whether the overall response time performance of the device has changed after the finished product is completed, which is uncontrollable and uncertain , the detection data can only be used as a reference, and cannot be directly used as the detection result of the response time of the overall structure of the device

The diaphragm of the semi-finished electrochromic device is exposed for a long time because it is not bonded to the protective layer (glass cover or protective film), that is, the open-time is long, and the reliability of the device is affected by the large amount of water in the early stage.

If the semi-finished electrochromic device diaphragm is tested in the middle section, due to the lack of structural support such as cover glass, possible operational bending during the test process will cause a series of adverse effects such as ITO cracks and wrinkles, which will reduce the overall yield of the device.

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