DDR signal quality auxiliary test fixture and test method
A technology for auxiliary testing and signal quality, applied in the direction of the casing of the measuring device, etc., can solve the problems of waste of substrate cost, high unit price of the substrate, affecting the impedance of the substrate, etc., to avoid changes in electrical performance, ensure electrical connection reliability, and easy disassembly and assembly. Effect
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[0022] The present invention will be further described below in conjunction with the accompanying drawings and specific embodiments.
[0023] Such as figure 1 and figure 2 As shown, the DDR signal quality auxiliary test fixture of the present embodiment includes a substrate 3 and a connection plate 2, the top side of the substrate 3 is welded with the DDR particle 4 and is provided with a test point 302, and the bottom side of the substrate 3 is provided with a connection with the DDR particle 4. 4 connected solder balls 301, the substrate 3 and the DDR particles 4 integrally form a test substrate; the connection board 2 is detachably mounted on the main board 1, and a plurality of probes 201 are arranged on the connection board 2, and one end of each probe 201 is connected to the main board 1 connection, the other end of each probe 201 is in one-to-one contact with the solder balls 301 on the substrate 3; the connection board 2 is also provided with a clamping component 5 f...
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