Supercharge Your Innovation With Domain-Expert AI Agents!

DDR signal quality auxiliary test fixture and test method

A technology for auxiliary testing and signal quality, applied in the direction of the casing of the measuring device, etc., can solve the problems of waste of substrate cost, high unit price of the substrate, affecting the impedance of the substrate, etc., to avoid changes in electrical performance, ensure electrical connection reliability, and easy disassembly and assembly. Effect

Pending Publication Date: 2022-01-14
NAT UNIV OF DEFENSE TECH
View PDF7 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Due to the way of direct welding, the substrate is a multi-layer buried resistance board. After the welding is removed, the impedance of the substrate will be affected, resulting in that the substrate is almost disposable and cannot be used multiple times.
Due to the relatively high unit price of the substrate, if there are many motherboards to be tested, the substrate will cause huge cost waste

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • DDR signal quality auxiliary test fixture and test method
  • DDR signal quality auxiliary test fixture and test method

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0022] The present invention will be further described below in conjunction with the accompanying drawings and specific embodiments.

[0023] Such as figure 1 and figure 2 As shown, the DDR signal quality auxiliary test fixture of the present embodiment includes a substrate 3 and a connection plate 2, the top side of the substrate 3 is welded with the DDR particle 4 and is provided with a test point 302, and the bottom side of the substrate 3 is provided with a connection with the DDR particle 4. 4 connected solder balls 301, the substrate 3 and the DDR particles 4 integrally form a test substrate; the connection board 2 is detachably mounted on the main board 1, and a plurality of probes 201 are arranged on the connection board 2, and one end of each probe 201 is connected to the main board 1 connection, the other end of each probe 201 is in one-to-one contact with the solder balls 301 on the substrate 3; the connection board 2 is also provided with a clamping component 5 f...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses a DDR signal quality auxiliary test fixture and a test method, the fixture comprises a substrate and a connecting plate, one side of the substrate is welded with DDR particles, and the other side of the substrate is provided with solder balls connected with the DDR particles; the connecting plate is detachably mounted on a main board, a plurality of probes are arranged on the connecting plate, one end of each probe is connected with the main board, and the other end of each probe is in one-to-one correspondence contact with one solder ball on a substrate; and the connecting plate is also provided with a clamping assembly which is used for clamping the DDR particles and the substrate on the connecting plate. The fixture has the advantages of being simple in structure, easy and convenient to disassemble and assemble, reusable and the like.

Description

technical field [0001] The invention mainly relates to the technical field of DDR board-mounted particle testing, in particular to a DDR signal quality auxiliary testing fixture and testing method. Background technique [0002] The on-board ddr signal quality test mainly measures the quality of the DDR signal channel of the PCB motherboard with an oscilloscope, and leads the signal through the DDR substrate to intercept the waveform closest to the DDR signal channel. For the prior art, the front and back sides of the DDR substrate are respectively welded to the DDR particles and the main board under test through pads. Since the substrate is directly welded and the substrate is a multi-layer buried resistance board, after the soldering is removed, the impedance of the substrate will be affected, resulting in that the substrate is almost disposable and cannot be used multiple times. Since the unit price of the substrate is relatively high, if there are many motherboards to be...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): G01R1/04
CPCG01R1/04
Inventor 邓林陈勇熊春霖陆超杰章润林罗旦颜磊黎源华
Owner NAT UNIV OF DEFENSE TECH
Features
  • R&D
  • Intellectual Property
  • Life Sciences
  • Materials
  • Tech Scout
Why Patsnap Eureka
  • Unparalleled Data Quality
  • Higher Quality Content
  • 60% Fewer Hallucinations
Social media
Patsnap Eureka Blog
Learn More