Electrical test wire clamp structure

Abstract

The invention discloses an electrical test wire clamp structure, and the structure comprises: a seat sleeve which is of a hollow tubular structure; a clamping part which is arranged outside the seat sleeve, wherein a pressing assembly is arranged on the clamping part; a conducting rod detachably installed in the socket sleeve and a connecting wire detachably connected to the conducting rod, wherein a connecting plug is arranged on an end of the connecting wire; a wire winding assembly used for storing the connecting wire, wherein a miniature anti-creeping switch connected to the wire winding assembly and used for detecting whether the connecting wire leaks electricity or not, the miniature anti-creeping switch is electrically connected with the connecting wire, and the conducting rod, the connecting wire, the miniature anti-creeping switch and the connecting plug form an electrical path. By implementing the electrical test wire clamp structure, the safety risks of electric shock and short circuit in the use process can be reduced; scratches of the clamping part on the surface of the electrical equipment are reduced, and the structure is simple, safe and reliable.

Description

technical field [0001] The invention relates to the technical field of electrical testing, in particular to an electrical testing wire clip structure. Background technique [0002] In the prior art, the clamp structure used for conventional electrical tests usually uses the end clamp part to contact the equipment to realize electrical connection. Due to the unreasonable design of the existing electrical test clamp structure, it is easy to cause gaps between different terminals during the installation process. The circuit is short-circuited, and there is a potential safety hazard of protection malfunction. [0003] At the same time, in order to ensure good contact, the clamping part of the electrical test wire clamp is mostly designed in a jagged shape, which is easy to scratch the conductive surface of the equipment when connected to the conductor surface of the electrical equipment; in addition, the structure of the conventional electrical test wire clamp is not convenient ...

AI Technical Summary

Problems solved by technology

[0002] In the prior art, the clamp structure used for conventional electrical tests usually uses the end clamp part to contact the equipment to realize electrical connection. Due to the unreasonable design of the existing electrical test clamp structure, it is easy to cause gaps between different terminals during the installation process. The circuit is short-circuited, and there is a safety hazard of protection malfunction

[0003] At the same time, in order to ensure good contact, the clamping part of the electrical test wire clamp is mostly designed in a jagged shape, which is easy to scratch the conductive surface of the equipment when connected to the conductor surface of the electrical equipment; in addition, the structure of the conventional electrical test wire clamp is not convenient for storage. Leakage is not easy to detect and may cause certain harm

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