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Conductive particle and testing socket comprising the same

A technology of conductive particles and test sockets, which is applied to the parts, conductors, circuits, etc. of electrical measuring instruments, can solve the problem of small contact area, achieve the effect of improving electrical performance, improving strength and durability, and increasing the number of times of use

Pending Publication Date: 2022-02-22
斯诺有限公司
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Especially, in the case of spherical particles, the contact area with the adjacent elastic material is small, so the above-mentioned problem is remarkable

Method used

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  • Conductive particle and testing socket comprising the same
  • Conductive particle and testing socket comprising the same
  • Conductive particle and testing socket comprising the same

Examples

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Embodiment Construction

[0063] Hereinafter, embodiments of the present invention will be described in detail with reference to the drawings. The present invention can be realized in various forms, and is not limited to the embodiments described here. In order to clarify the present invention, parts irrelevant to the description are omitted from the drawings, and the same reference numerals are assigned to the same or similar constituent elements throughout the specification.

[0064] Throughout the specification, when a certain part is "connected" to another part, it includes not only the case of "direct connection" but also the case of "indirect connection" with other components in between. In addition, the term "comprising" used herein means that other constituent elements are not excluded but further include other constituent elements unless there is a particular contrary statement.

[0065] Embodiments of the present invention will be described in detail below with reference to the drawings.

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Abstract

An embodiment of the present invention provides a conductive particle used for a testing socket electrically connecting a lead of a device to be tested and a pad of a test board by being arranged between the device to be tested and the test board, wherein the conductive particle comprises a plurality of protrusions formed at equal intervals along a circumference, and a testing socket comprising the same.

Description

technical field [0001] The present invention relates to a conductive particle and a test socket including the same, more specifically, to the conductive particle and the test socket, the above-mentioned test socket arranges the above-mentioned conductive particle between the element to be tested and the test board, so that The leads of the component under test and the pads of the test board are electrically connected to each other. Background technique [0002] Usually, after the manufacturing process of the device to be tested, such as a semiconductor device, etc., the device to be tested needs to be tested. That is, an electrical test is performed on a finished manufactured device-to-be-tested element such as a semiconductor element to determine whether it is defective. Specifically, whether or not the element under test is defective is determined by sending a predetermined test signal from the testing device to the element under test. [0003] These test sockets need to...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): H01B7/00G01R1/04
CPCH01B7/00G01R1/0416G01R1/0466G01R1/16G01R1/0441G01R31/2863G01R31/2884G01R31/2879
Inventor 金奎铣
Owner 斯诺有限公司
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