Memory voltage test method, device, computing equipment and system

A technology of voltage testing and memory, applied in static memory, instruments, etc., can solve the problems of low voltage adjustment efficiency, cumbersome memory voltage test operation process, etc., and achieve the effect of complete coverage of voltage adjustment

Pending Publication Date: 2022-03-01
SUZHOU LANGCHAO INTELLIGENT TECH CO LTD
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Problems solved by technology

[0006] In view of this, the embodiments of the present invention provide a memory voltage testing method, device, computing device and system method, aiming to solve the p

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  • Memory voltage test method, device, computing equipment and system
  • Memory voltage test method, device, computing equipment and system
  • Memory voltage test method, device, computing equipment and system

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[0053] In order to make the objects, technical solutions, and advantages of the present invention more clearly, the technical solutions in the embodiments of the present invention will be described in contemplation in the embodiment of the present invention. It is an embodiment of the invention, not all of the embodiments. Based on the embodiments of the present invention, those skilled in the art do not have all other embodiments obtained by creative labor, all of which are protected by the present invention.

[0054] It should be noted that the method of the memory voltage test provided by the present application, and its execution body can be a memory voltage test, the memory voltage test can be implemented by software, hardware or hardware, and is implemented as a computer device. Part or all, where the computer device can be a server or a terminal, wherein the server in the present application may be a server, or a server cluster consisting of a plurality of servers, the term...

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Abstract

The invention relates to the field of computer equipment, in particular to a memory voltage testing method, device, computing equipment and system, which are applied to a BMC (Baseboard Management Controller), the BMC is connected with the memory equipment, the method comprises the following steps: acquiring a voltage adjusting instruction, the voltage adjusting instruction is used for indicating to adjust the output voltage in the memory equipment; acquiring a current state corresponding to the memory device; and adjusting the output voltage of the memory device according to the current state so as to test the memory device. According to the memory voltage testing method, the BMC obtains the voltage adjusting instruction and then adjusts the output voltage of the memory device, so that the operation of adjusting the output voltage of the memory device is reduced, no extra tool is needed, and the memory voltage testing efficiency is improved. In addition, the output voltage of the memory device in various states can be adjusted, and the test accuracy of the memory device can be improved.

Description

technical field [0001] The present invention relates to the field of computer equipment, in particular to a memory voltage testing method, device, computing equipment and system. Background technique [0002] With the rapid development of cloud computing and big data technology, the trend of informatization and intelligence in the current society is accelerating. As the core equipment of the information system, the server has higher and higher requirements for performance and reliability. Sufficient and rigorous testing should be carried out during server development to ensure product quality. Memory, as one of the important components, is the part that needs to be focused on during the testing process. [0003] The memory four-corner test is an important one among memory-related tests, including four conditions: high temperature and low pressure, high temperature and high pressure, low temperature and low pressure, and low temperature and high pressure. After putting the s...

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Application Information

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IPC IPC(8): G11C29/56
CPCG11C29/56
Inventor 肖时航
Owner SUZHOU LANGCHAO INTELLIGENT TECH CO LTD
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