Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Waviness measuring device and use method

A measuring device and waviness technology, applied in the field of aircraft measurement, can solve the problems of poor accessibility, complex composition, large volume, etc., and achieve the effect of simple structure, convenient operation, and small volume

Pending Publication Date: 2022-03-04
中航通飞华南飞机工业有限公司
View PDF1 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, the system has a complex composition and a large volume. For areas like the top of the fuselage, the accessibility for measurement is poor.

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Waviness measuring device and use method
  • Waviness measuring device and use method

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0023] This part is the embodiment of the present invention, which is used to explain and illustrate the technical solution of the present invention.

[0024] A waviness measuring device, comprising a spline 1, a sensor 2 and a data transmission and power supply module 3, a number of sensors 2 are distributed on the spline 1 at certain intervals, and the data transmission and power supply module 3 is connected to all sensors 2 for data transmission ;Sensor 2 is a distance sensor, and the detection direction is below spline 1.

[0025] Further, spline 1 is a strip-like structure.

[0026] Further, the spline 1 is a material with suitable elasticity and rigidity, such as a polyurethane rubber strip.

[0027] Further, the sensor 2 is a laser sensor or an infrared sensor.

[0028] Further, the probes of all sensors 2 are flush with the bottom of spline 1.

[0029] Further, the sensor 2 is connected to the spline 1 in a fixed installation manner, specifically, the sensor 2 is em...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention belongs to the technical field of aircraft measurement, and discloses a waviness measuring device and a use method, the waviness measuring device comprises a spline, a plurality of sensors and a data transmission and power supply module, the plurality of sensors are distributed on the spline at certain intervals, and the data transmission and power supply module is in data transmission connection with all the sensors; the sensor is a distance sensor, and the detection direction is below the spline. According to the invention, waviness of surfaces with different curvatures can be rapidly measured; by customizing measuring devices of different sizes, the surface of any concerned aircraft part can be directly measured, and compared with a laser tracker and a laser scanning mode, the device is simple in structure, small in size and convenient to operate, and has better applicability to a measurement object, a measurement environment and a measurement site.

Description

technical field [0001] The invention belongs to the technical field of aircraft measurement, and relates to an aircraft surface measurement device, in particular to a waviness measurement device and a use method. Background technique [0002] Waviness, also known as waviness, is one of the shape error components that form the surface topography of workpieces or parts. It refers to those relatively wavy ups and downs that appear periodically and repeatedly on the surface of the workpiece due to the influence of pressure and deformation factors during the stretching or heat treatment of the parts during the processing process. Small shape errors. Waviness is an important part of surface quality control. [0003] At present, there are mainly two measurement methods, traditional tools and laser tracker measurement. [0004] If the surface waviness is measured using traditional measuring tools, it is necessary to place the spline or steel ruler at the measuring station first, ...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
IPC IPC(8): G01B11/00
CPCG01B11/00
Inventor 赵富荣李欣魏猛彭新春
Owner 中航通飞华南飞机工业有限公司
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com