Method and apparatus for monitoring radiation

Abstract

The invention relates to a method and a device (110) for monitoring radiation (112) emitted by a radiation-emitting element of a thermal radiation source in the visible spectral range and in the infrared spectral range, in particular for determining the emission spectrum of a thermal radiation source. Herein, the method comprises the steps of: a) providing a thermal radiation source comprising a radiation-emitting element, where the radiation-emitting element emits radiation (112) to be monitored, where the radiation-emitting element comprises a filament (114) of an incandescent lamp (116) or a radiation-emitting surface of a thermal infrared emitter; b) providing at least one radiation-sensitive element (124), the radiation-sensitive element (124) being specified for measuring the radiation (112) emitted by the radiation-emitting element; c) measuring the spectral emissivity of the radiation (112) emitted by the radiation emitting element at at least two separate wavelengths; and d) determining the emission temperature of the radiation-emitting element by providing a ratio of the measured values of the spectral radiance of the radiation (112) at at least two individual wavelengths wherein the ratio of the measured values of the spectral radiance for two of the individual wavelengths is approximated by using a second order polynomial function (158) in a temperature range of 1000 K to 4000 K, as a function of temperature. The method and apparatus (110) may be used to monitor the operating mode of a thermal radiation source, in particular in spectral applications within the visible spectral range and the infrared spectral range in which the thermal radiation source is used as an illumination source.

Description

technical field [0001] The invention relates to a method and a device for monitoring radiation emitted by a thermal radiation source, in particular by an incandescent lamp or a thermal infrared emitter, in the visible and infrared spectral ranges, in particular for determining the emission spectrum of a thermal radiation source . Furthermore, the invention relates to a computer program product comprising executable instructions for performing the method. The method, computer program product, and apparatus can be used to monitor various modes of operation of a thermal radiation source, particularly in spectroscopic applications in the visible and infrared spectral ranges where the thermal radiation source can preferably be used as an illumination source. Background technique [0002] Various methods and devices for monitoring radiation, such as light in the visible and infrared spectral ranges, are known and have been used in particular to determine the emission spectrum of ...

AI Technical Summary

Problems solved by technology

Here, special care needs to be taken to find the lamp at room temperature T 0 under the resistor R 0 , which especially affects the quality and accuracy of the calibration procedure

Even small errors in the current and voltage measurements can lead to large variations in the temperature T determined in this way

In addition, variations in the filament, especially those caused by the evaporation of tungsten during lamp operation, may cause systematic errors in determining the filament temperature T in the lamp

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