Double-end double-acting probe capable of being bent at will

A bending and probe technology, applied in the field of semiconductor testing equipment, can solve problems such as difficult angle adjustment of needle shafts and needle sleeves, and achieve the effects of low manufacturing cost, good market promotion and use prospects, and good adaptability

Pending Publication Date: 2022-03-18
渭南木王智能科技股份有限公司
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] The purpose of the present invention is to provide a double-headed double-action probe that can be bent arbitrarily, so as to solve the problem that it is difficult to adjust the angle when the existing needle shaft and needle sleeve are assembled together

Method used

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  • Double-end double-acting probe capable of being bent at will
  • Double-end double-acting probe capable of being bent at will

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Embodiment Construction

[0018] Embodiments of the present invention are described in detail below, examples of which are shown in the drawings, wherein the same or similar reference numerals designate the same or similar elements or elements having the same or similar functions throughout. The embodiments described below by referring to the figures are exemplary only for explaining the present invention and should not be construed as limiting the present invention.

[0019] In the description of the present invention, if the first and the second are described only for the purpose of distinguishing technical features, it cannot be understood as indicating or implying relative importance or implicitly indicating the number of indicated technical features or implicitly indicating The sequence of the indicated technical features.

[0020] In the description of the present invention, unless otherwise clearly defined, words such as setting, installation, and connection should be understood in a broad sense...

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Abstract

The invention discloses a double-end double-acting probe capable of being bent at will, which comprises a first probe sleeve, wherein one end of the first probe sleeve is provided with a first probe shaft; a second needle shaft is arranged at one end of the second needle sleeve; the two ends of the elastic piece are connected with the other end of the first needle sleeve and the other end of the second needle sleeve respectively, and the elastic piece can be elastically bent. According to the double-head double-acting probe capable of being bent at will, the problem that angle adjustment is difficult to carry out due to the fact that an existing probe shaft and an existing probe sleeve are assembled together is solved.

Description

technical field [0001] The invention belongs to the technical field of semiconductor detection equipment, and in particular relates to a double-headed double-action probe that can be bent arbitrarily. Background technique [0002] Test probes are widely used in technical fields such as mobile phones, automobiles, medical and aerospace, and are high-end electronic components. [0003] The needle cover is an important assembly part of the probe, which is used to install the needle shaft. The existing needle sleeve and needle shaft are generally fixedly installed together, and the two cannot be moved or adjusted for angle during use. Therefore, for some test positions that can only be reached by bending, it is difficult for the needle shaft needle cover assembly structure of this type of structure to adapt to the work. Contents of the invention [0004] The purpose of the present invention is to provide a double-headed double-action probe that can be bent arbitrarily, so as...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R1/073
CPCG01R1/07357
Inventor 张飞龙付盼红申啸
Owner 渭南木王智能科技股份有限公司
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