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Automatic test method for WAT test software

A technology for testing software and automatic testing, applied in software testing/debugging, error detection/correction, instruments, etc., it can solve the problems of not providing self-checking, unselected macros, compilation errors, etc., to achieve strong applicability and improve testing. Efficiency, the effect of ensuring correctness

Pending Publication Date: 2022-05-06
SEMITRONIX
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AI Technical Summary

Problems solved by technology

Existing automated testing technologies are mainly aimed at testing on the WEB side. The automated testing of CS architecture software is not yet mature, especially in the testing of multi-terminal communication software systems such as WAT testing software systems. The effective application of existing automated testing is still very lacking.
[0004] In addition, in the development process of WAT test software, in order to achieve better user experience and customized needs between different customers, software functions need to be continuously updated, and the code size will continue to expand, which will directly lead to compilation time and error probability Greatly increased, in the process of manual compilation, there will be compilation errors caused by unselected macros or uncleared caches, which seriously affects the quality of software releases
At present, manual code compilation is relatively common, and automatic compilation has not yet added an error correction mechanism, resulting in the inability to guarantee the correctness of code macro selection during the compilation process, and the current automatic test does not provide a feasible solution for self-testing during the compilation phase

Method used

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  • Automatic test method for WAT test software
  • Automatic test method for WAT test software
  • Automatic test method for WAT test software

Examples

Experimental program
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Effect test

Embodiment 1

[0027] In the automatic test stage, testers are performing simulation tests on the generated WAT test software. Generally, it is necessary to manually send multiple GEM commands to the WAT test software on the EAP side, and at the same time, the Prober side also needs to send multiple GEM commands to the WAT test software. WAT test For the communication between the software and the EAP terminal and Prober terminal, please refer to figure 1 . In this embodiment, in order to improve the testing efficiency of testers, automated testing is realized, such as figure 2 As shown, in the present embodiment, the automatic test method for WAT test software includes the following specific process steps S1 in the automatic test phase. Test execution files are set and run, automatically send some test cases to the WAT test software for testing, and automatically generate log The file records the execution results of each test case in the test execution file; step S2. According to the gene...

Embodiment 2

[0035] Such as Figure 5 As shown, the automatic testing method for the WAT testing software in the second embodiment also includes a self-checking step in the compiling stage. In the compilation stage, the software code is generally downloaded from SVN, and then the Cmake software is automatically called to select different types of macros to compile corresponding to different versions of software. The current general process of compilation is: open Cmake, select the corresponding type macro to generate the project file on the VS (Visual Studio) compiler, and then open the VS compiler to compile the required version of the WAT test software; Cmake macros are not added or the project in VS is not cleared, resulting in the loss of some functions of the compiled software or the problem of code confusion, which seriously affects the quality of software version release. The self-inspection carried out in the compiling phase before the test phase before publishing in the automatic...

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Abstract

The invention provides an automatic test method for WAT test software, which comprises the following steps in a test stage: S1, setting and running a test execution file, automatically sending a plurality of test cases to the WAT test software for testing, and automatically generating a log file to record execution results of all or part of the test cases in the test execution file; and S2, according to the log file, judging whether a test result of the test case meets a preset standard or not, and judging whether the quality of the WAT test software meets the standard or not. By setting and running the test execution file, automatic testing of the WAT test software is achieved, different test scenes can be covered by setting the test case set in the test execution file in a targeted mode, the applicability in different application scenes is higher, human errors are effectively avoided, the test efficiency can be greatly improved, and the test efficiency is improved. The research and development cycle of the test software is optimized to the maximum extent, and the working efficiency is comprehensively improved.

Description

technical field [0001] The invention belongs to the technical field of automated testing, in particular to a method for automatically testing testing software used for WAT (Wafer Acceptance Test). Background technique [0002] Using software for testing is an important method to improve product quality and user experience. The test software used for WAT (Wafer Acceptance Test) needs to verify the usability and ease of use of new functions before release. In addition to verifying new functions before each version release, all previous functions need to be tested, such as Regression testing, performance testing, stress testing, etc., to ensure that the released software version is reliable and stable. Traditionally, the testing of the WAT testing software system before release is carried out manually. During these testing processes, a large number of repetitive operations are performed on the software, which consumes a lot of labor and time costs, and inevitably produces Som...

Claims

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Application Information

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IPC IPC(8): G06F11/36
CPCG06F11/3684G06F11/3676G06F11/3688
Inventor 李成霞唐宁敏
Owner SEMITRONIX
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