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Product analysis method, system and device and medium

A product analysis and product technology, applied in the field of intelligent manufacturing and artificial intelligence, can solve the problems of large influence of parameter elimination process threshold setting, difficult association rules, complex influence relationship, etc., to achieve strong flexibility and scalability, auxiliary adjustment and optimization , the effect of strong interpretability

Active Publication Date: 2022-05-06
CHENGDU UNION BIG DATA TECH CO LTD
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  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0009] Advantages of the solution: It combines the process and experience of historical parameter analysis in the industrial manufacturing process, and fits the business scenarios of industrial manufacturing; disadvantages of the solution: the processing process relies too much on the manual experience of business experts, and the parameter elimination process is greatly affected by the threshold setting
[0014] Advantages of the scheme: the probability of abnormal types is given through the probability graph model, which has strong explanatory power; disadvantages of the scheme: (1) This method is mainly aimed at the operation and maintenance data, between the production and processing data in industrial manufacturing and the operation and maintenance data (2) When the amount of sample data is far less than the parameter dimension, it is difficult to construct a probability graphical model
Disadvantages of the solution: the extraction of association rules is relatively difficult, especially for the field of root cause detection of industrial product defects. The process is complex, involving many parameters, and the influence relationship between parameters is complicated. It is difficult to effectively extract accurate association rules

Method used

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  • Product analysis method, system and device and medium
  • Product analysis method, system and device and medium
  • Product analysis method, system and device and medium

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Embodiment 1

[0084] Please refer to figure 1 , figure 1 It is a schematic flow chart of a product analysis method, Embodiment 1 of the present invention provides a product analysis method, the method comprising:

[0085] Obtain the quality inspection data of the product, and label the quality inspection data to obtain the label data;

[0086] Obtaining the original processing data of the product, cleaning the original processing data to obtain first process flow data, and preprocessing the first process flow data to obtain second process flow data;

[0087] training the first classification prediction model based on the labeled data and the second process flow data to obtain a second classification prediction model;

[0088] Obtain the data to be analyzed, input the data to be analyzed into the second classification prediction model, and the second classification prediction model outputs the predicted value of each production process parameter in the data to be analyzed;

[0089] calcul...

Embodiment 2

[0149] On the basis of Embodiment 1, in order to more clearly demonstrate the purpose, technical solutions and advantages of the present invention, the following takes the problem of the root cause location of defective products in the production of glass panels as an example, and combines the accompanying drawings and specific embodiments to analyze the present invention. The invention is described in detail.

[0150] It should be understood that the specific embodiments described here are only used to explain the present invention, not to limit the present invention.

[0151] Such as figure 1 Shown is a flow chart of a preferred embodiment of the method for locating the root cause of process defects of the present invention. According to different requirements, the order of some steps in the flow chart can be adjusted, and some steps can be omitted.

[0152] During the manufacturing process of glass panels, the fluctuation of the parameter values ​​set by the process equipm...

Embodiment 3

[0221] The present invention provides a product analysis system in real time, please refer to Figure 4 , Figure 4 It is a schematic diagram of the composition of the product analysis system, and the system includes:

[0222] An annotation unit, configured to obtain quality inspection data of the product, and annotate the quality inspection data to obtain the annotation data;

[0223] The cleaning and preprocessing unit is used to obtain the original processing data of the product, clean the original processing data to obtain the first process flow data, and perform preprocessing on the first process flow data to obtain the second process flow data;

[0224] A training unit, configured to train the first classification prediction model based on the labeled data and the second process flow data to obtain a second classification prediction model;

[0225] A model processing unit, configured to obtain data to be analyzed, input the data to be analyzed into the second classific...

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Abstract

The invention discloses a product analysis method, system and device and a medium, and relates to the technical field of intelligent manufacturing and artificial intelligence, and the method comprises the steps: carrying out the training of cleaned and preprocessed data, and obtaining a classification prediction model; obtaining a predicted value of each production process parameter in the to-be-analyzed data by using the classification prediction model; and calculating and obtaining the SHAP value of each production process parameter based on the predicted value of each production process parameter. According to the method, the names of a plurality of key process links and a plurality of key production process parameters which influence the product quality can be accurately and quickly obtained based on the SHAP value of each production process parameter.

Description

technical field [0001] The present invention relates to the technical fields of intelligent manufacturing and artificial intelligence, in particular, to a product analysis method, system, device and medium. Background technique [0002] The root cause location method of industrial product defects is applied to product quality control and process parameter optimization tasks in the field of industrial manufacturing. In the process of industrial manufacturing, reducing the defect rate of products is crucial to the quality control of enterprises. The core is to accurately and quickly locate the root cause of defects in the production and processing process, that is, to detect and locate key process parameters that affect product quality, and then Through the analysis and adjustment of key process parameters, the production process can be improved and the product quality can be improved. [0003] For the location of the root cause of industrial product defects, the existing tec...

Claims

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Application Information

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IPC IPC(8): G06Q10/06G06Q10/04G06N20/00G06K9/62G06Q10/10
CPCG06Q10/06395G06N20/00G06Q10/103G06Q10/04G06F18/24G06F18/214Y02P90/30
Inventor 不公告发明人
Owner CHENGDU UNION BIG DATA TECH CO LTD
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