Product analysis method, system and device and medium

A product analysis and product technology, applied in the field of intelligent manufacturing and artificial intelligence, can solve the problems of large influence of parameter elimination process threshold setting, difficult association rules, complex influence relationship, etc., to achieve strong flexibility and scalability, auxiliary adjustment and optimization , the effect of strong interpretability

Active Publication Date: 2022-05-06
CHENGDU UNION BIG DATA TECH CO LTD
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Problems solved by technology

[0009] Advantages of the solution: It combines the process and experience of historical parameter analysis in the industrial manufacturing process, and fits the business scenarios of industrial manufacturing; disadvantages of the solution: the processing process relies too much on the manual experience of business experts, and the parameter elimination process is greatly affected by the threshold setting
[0014] Advantages of the scheme: the probability of abnormal types is given through the probability graph model, which has strong explanatory power; disadvantages of the scheme: (1) This method is mainly aimed at the oper

Method used

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  • Product analysis method, system and device and medium
  • Product analysis method, system and device and medium
  • Product analysis method, system and device and medium

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Example Embodiment

[0083] Embodiment 1

[0084] Please refer to Figure 1 ， Figure 1 As a flow diagram of a product analysis method, embodiment 1 of the present invention provides a product analysis method, the method comprising:

[0085] Obtaining the quality detection data of the product, labeling the quality detection data to obtain the labeling data;

[0086] Obtaining the original processing data of the product, cleaning the original processing data to obtain the first process flow data, and preprocessing the first process flow data to obtain the second process flow data;

[0087] Training the first classification prediction model based on the labeled data and the second process flow data to obtain the second classification prediction model;

[0088] Obtaining the data to be analyzed, inputting the data to be analyzed into the second classification prediction model, and the second classification prediction model outputs the predicted value of each production process parameter in the data to be a...

Example Embodiment

[0148] Example 2

[0149] On the basis of embodiment 1, in order to more clearly show the purpose, technical scheme and advantages of the invention, the invention is described in detail in combination with the attached drawings and specific embodiments by taking the problem of poor root cause positioning of defective products in the production and manufacture of glass panels as an example.

[0150] It should be understood that the specific embodiments described herein are only used to explain the invention and are not used to limit the invention.

[0151] as Figure 1 Shown is a flowchart of a preferred embodiment of the process defect root cause location method of the invention. According to different requirements, the sequence of some steps in the flowchart can be adjusted and some steps can be omitted.

[0152] In the process of glass panel manufacturing, the fluctuation of parameter values set by process equipment will lead to the output of bad glass. The processing parameters ...

Example Embodiment

[0220] Example 3

[0221] The invention provides a product analysis system, please refer to Figure 4 ， Figure 4 Is the composition diagram of the product analysis system, which comprises:

[0222] A labeling unit for obtaining the quality detection data of the product, labeling the quality detection data to obtain the labeling data;

[0223] A cleaning and preprocessing unit for obtaining the original processing data of the product, cleaning the original processing data to obtain the first process flow data, and preprocessing the first process flow data to obtain the second process flow data;

[0224] A training unit for training the first classification prediction model based on the marked data and the second process flow data to obtain the second classification prediction model;

[0225] A model processing unit for obtaining the data to be analyzed, inputting the data to be analyzed into the second classification prediction model, and the second classification prediction model o...

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Abstract

The invention discloses a product analysis method, system and device and a medium, and relates to the technical field of intelligent manufacturing and artificial intelligence, and the method comprises the steps: carrying out the training of cleaned and preprocessed data, and obtaining a classification prediction model; obtaining a predicted value of each production process parameter in the to-be-analyzed data by using the classification prediction model; and calculating and obtaining the SHAP value of each production process parameter based on the predicted value of each production process parameter. According to the method, the names of a plurality of key process links and a plurality of key production process parameters which influence the product quality can be accurately and quickly obtained based on the SHAP value of each production process parameter.

Description

technical field [0001] The present invention relates to the technical fields of intelligent manufacturing and artificial intelligence, in particular, to a product analysis method, system, device and medium. Background technique [0002] The root cause location method of industrial product defects is applied to product quality control and process parameter optimization tasks in the field of industrial manufacturing. In the process of industrial manufacturing, reducing the defect rate of products is crucial to the quality control of enterprises. The core is to accurately and quickly locate the root cause of defects in the production and processing process, that is, to detect and locate key process parameters that affect product quality, and then Through the analysis and adjustment of key process parameters, the production process can be improved and the product quality can be improved. [0003] For the location of the root cause of industrial product defects, the existing tec...

Claims

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Application Information

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IPC IPC(8): G06Q10/06G06Q10/04G06N20/00G06K9/62G06Q10/10
CPCG06Q10/06395G06N20/00G06Q10/103G06Q10/04G06F18/24G06F18/214Y02P90/30
Inventor 不公告发明人
Owner CHENGDU UNION BIG DATA TECH CO LTD
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