Microscopic observation equipment with sample supporting function

Abstract

The invention belongs to the technical field of microscopic observation, and particularly relates to microscopic observation equipment with a sample supporting function, the microscopic observation equipment comprises a microscope base, an electron microscope and a sample chamber, the inner walls of the two sides, close to the upper part, of the sample chamber are each provided with three placement grooves, and the inner wall of each placement groove is fixedly connected with second hydraulic cylinders at equal intervals. By arranging the vacuumizing assembly, after a sample is ejected out of the sample chamber, part of outside air enters the sample chamber, the diffusion range of the air is limited through a first flow limiting plate and a second flow limiting plate, a vacuum pump is started, and the vacuum pump extracts gas in the sample chamber through vacuumizing holes in a hollow gas extraction plate; in the working process of the vacuum pump, the first hydraulic cylinder is adjusted to drive the pushing plate to push, and the air range in the sample chamber is compressed, so that air is rapidly pumped out through the vacuum pump, the overall progress of sample microscopic observation is improved, and the use value of the microscopic observation equipment is improved.

Description

technical field [0001] The invention relates to the technical field of microscopic observation, in particular to a microscopic observation device with a sample support function. Background technique [0002] A microscope is an optical instrument composed of a lens or a combination of several lenses, which is a sign that human beings have entered the atomic age; a microscope is an instrument mainly used to magnify tiny objects that can be seen by human eyes. Microscopes are divided into optical microscopes and electron microscopes: optical microscopes were first invented by Jansen in the Netherlands in 1590; the current optical microscopes can magnify objects by 1600 times, and the minimum limit of resolution reaches 1 / 2 of the wavelength. The length of the domestic microscope mechanical barrel is average is 160 mm. [0003] Existing microscopic observation equipment generally uses electron microscopes for microscopic observation of samples. During the working process of ele...

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Problems solved by technology

[0003] Existing microscopic observation equipment generally uses electron microscopes for microscopic observation of samples. During the working process of electron microscopes, the vacuum degree of the sample chamber where the electron beam emitted from the lens barrel enters should be kept at a level of about 10-3 Torr , this is because if the sample chamber is in a low vacuum, the gas will flow back to the lens barrel that maintains a high vacuum. After entering the sample chamber, errors in the sample results observed through the electron microscope reduce the accuracy of the microscopic observation results, resulting in the lack of use value of the microscopic observation equipment

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