A high temporal and spatial resolution full-field heat release rate measurement method and system
A technology of time-space resolution and heat release rate, which is applied in the field of optical measurement, can solve the problems that the heat release rate cannot be solved separately, and achieve the effect of alleviating the insufficient resolution of heat release rate measurement and accurate measurement results
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Embodiment 1
[0023] figure 1 This is a flow chart of a method for measuring a full-field heat release rate with high temporal and spatial resolution provided by an embodiment of the present invention, and the method is applied to a measuring device provided by an embodiment of the present invention. specific, figure 2 is a schematic diagram of a measurement device provided according to an embodiment of the present invention, such as figure 2 As shown, the device includes: an illumination light source 10 , a background pattern 20 and an imaging device 40 . Optionally, as figure 2 As shown, the measuring device also includes an image sensor 50 and a processing device 60 .
[0024] The illumination light source 10 , the background pattern 20 , the imaging device 40 and the image sensor 50 are sequentially arranged on the same straight line; the flame 30 to be measured is arranged between the background pattern 20 and the imaging device 40 .
[0025] Optionally, in this embodiment of th...
Embodiment 2
[0062] image 3 It is a schematic diagram of a full-field heat release rate measurement system with high temporal and spatial resolution provided according to an embodiment of the present invention. like image 3 As shown, the system includes: a first acquisition module 100 , a second acquisition module 200 , a third acquisition module 300 , a first calculation module 400 , a second calculation module 500 and a third calculation module 600 .
[0063] Specifically, the first acquisition module 100 is configured to acquire the imaging of the background pattern in the measuring device under the illumination of the illumination light source, and obtain the reference image.
[0064] The background pattern is a pattern generated based on the Poisson disk sampling method; the measurement device includes: an illumination light source, a background pattern and an imaging device, wherein the illumination light source, the background pattern, and the imaging device are sequentially arra...
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