Test system for charging and discharging integrated circuit chip

Abstract

The invention discloses a test system for a charge-discharge integrated circuit chip, and the system comprises a to-be-tested chip module, a current / voltage source module, a double-pole double-throw relay S1 module, and a double-pole double-throw relay S2 module, and the to-be-tested chip module is used for placing a to-be-tested chip. The current / voltage source module is used for connecting a to-be-tested chip with a corresponding current / voltage source through a test machine, and the double-pole double-throw relay S1 module is used for connecting a pin interface in the to-be-tested chip through two output capacitors. The double-pole double-throw relay S2 module is used for being connected with a pin interface in a to-be-tested chip through two programming resistors, the to-be-tested chip module is electrically connected with the current / voltage source module, and the current / voltage source module is electrically connected with the double-pole double-throw relay S1 module and the double-pole double-throw relay S2 module. The device has the characteristics of flexible connection mode and random switching of test states.

Description

technical field [0001] The invention relates to the technical field of chip testing, in particular to a testing system for charging and discharging integrated circuit chips. Background technique [0002] The XC5101 is a complete single-cell lithium-ion battery constant current constant voltage linear charger, its SOP package and low external component count make the XC5101 very suitable for portable applications, in addition, the XC5101 is specially designed to work within the USB power specification, and is applied It can be used in various aspects such as mobile phone, PDA, MP3 / MP4 player charging base and base Bluetooth, GPS, etc. [0003] For the test of this kind of charging and discharging integrated circuit chip, it is necessary to restore various real and specific application scenarios during the test process, so that the chip to be tested can work in different states, but in the test, the chip is usually only used in one working state. One kind of programming resis...

AI Technical Summary

Problems solved by technology

[0003] For the test of this kind of charging and discharging integrated circuit chip, it is necessary to restore various real and specific application scenarios during the test process, so that the chip to be tested can work in different states, but in the test, the chip is usually only used in one working state. One kind of programming resistor and output capacitor, but the same series of voltage regulator chips may need to be used in a variety of different programming resistors and a variety of different output capacitors, and then switch between different programming resistors and output capacitors when switching the working state. Capacitance makes the operation of the chip under test repeated, time-consuming and laborious during the test process, and leads to high hardware costs. Therefore, a test system for charging and discharging integrated circuit chips is designed to change the flexible connection mode to switch the test state of the chip under test arbitrarily. is very necessary

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