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Method for calibrating and optimizing quantum gate in experiment

A quantum gate and experimental technology, applied in the field of quantum computing, can solve the problem of inaccurate data and achieve the effect of accurate and fast calibration

Pending Publication Date: 2022-05-13
UNIV OF SCI & TECH OF CHINA
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0005] Based on the above problems, this disclosure provides a method for calibrating and optimizing quantum gates in experiments to alleviate technical problems such as statistical distribution caused by quantum measurement and inaccurate data caused by random noise in the system in the prior art

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  • Method for calibrating and optimizing quantum gate in experiment
  • Method for calibrating and optimizing quantum gate in experiment
  • Method for calibrating and optimizing quantum gate in experiment

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Embodiment Construction

[0031] The disclosure provides a method for calibrating and optimizing a quantum gate in an experiment. According to the random characteristics of the test circuit, the error of the quantum gate is accumulated and measured, thereby reducing the error of testing and calculating the fidelity of a single quantum gate. On the other hand, according to the noise characteristics of the system, a pulse sequence is disclosed to reduce the influence of the low-frequency noise of the system on the test data, so that the test data has better stability. Based on the above two points, the test scheme proposed in this disclosure has the characteristics of accurately and quickly measuring the fidelity of quantum gates, and has important applications in the field of optimizing quantum gates in experiments.

[0032] Using randomized Clifford gates to calibrate the fidelity of Clifford group element quantum gates is one of the current methods for calibrating quantum gates, also known as randomize...

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Abstract

The invention provides a method for calibrating and optimizing a quantum gate in an experiment. The method comprises the following steps: S1, obtaining a quantum circuit comprising a plurality of adjoint Clifford gates, and calculating the average fidelity of the adjoint Clifford gates; s2, according to the average fidelity of the accompanying Clifford gates, determining the number of the corresponding accompanying Clifford gates when the error amplification factor is maximum; s3, generating a calibration circuit based on the number of the accompanying Clifford gates, alternately using the initial CZ gate to test the calibration circuit to obtain a first fidelity, and using the optimized CZ gate to test the calibration circuit to obtain a second fidelity; and S4, creating an objective function according to the first fidelity and the second fidelity, and evaluating the increase amount of the average fidelity accompanying the Clifford gate, thereby optimizing the CZ gate.

Description

technical field [0001] The disclosure relates to the technical field of quantum computing, and in particular to a method for quickly calibrating and optimizing a quantum gate in an experiment. Background technique [0002] Today is the initial stage of the development of quantum computer technology. How to realize the precise control of quantum systems is the focus of the development of quantum computing. Superconducting quantum chips realized by superconducting qubits are currently one of the most effective physical platforms for quantum computing. How to realize precise control of large-scale superconducting quantum chips is the core technology and challenge to improve the precision of quantum manipulation. [0003] Due to the statistical distribution caused by the quantum measurement, as well as the influence of the random noise of the system, the test data of the experiment will introduce a certain degree of random fluctuation. How to quickly and accurately calibrate th...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06N10/20
CPCG06N10/00
Inventor 李少炜陈厦微龚明吴玉林梁福田彭承志朱晓波潘建伟
Owner UNIV OF SCI & TECH OF CHINA
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